Testing for small-delay defects in nanoscale CMOS integrated circuits

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Title:

Author:

Goel, Sandeep K, editor of compilation.

ISBN:

9781315217819

9781351825016

9781439829424

Physical Description:

1 online resource

Series:

Devices, circuits, and systems

Devices, circuits, and systems.

Contents:

section 1. Timing-aware ATPG -- section 2. Faster-than-at-speed -- section 3. Alternative methods -- section 4. SDD metrics.

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Library	Material Type	Item Barcode	Shelf Number	Status	Item Holds
Searching... Online Library	E-Book	547467-1001	TK7871.99 .M44 T43 2014	Searching... Unknown	Searching... Unavailable