Title:
Applications and metrology at nanometer scale. 2, Measurement systems, quantum engineering and RBDO method
Author:
Dahoo, Pierre Richard, author.
ISBN:
9781119818984
Physical Description:
1 online resource
Series:
Reliability of Multiphysical Systems Set ; Volume 10
Reliability of multiphysical systems set ; v. 10.
Contents:
Measurement Systems Using Polarized Light -- Quantum-scale Interaction -- Quantum Optics and Quantum Computers -- Reliability-based Design Optimization of Structures -- Short Overview of Quantum Mechanics -- References -- Index -- Other titles from iSTE in Mechanical Engineering and Solid Mechanics
Local Note:
John Wiley and Sons
Electronic Access:
https://onlinelibrary.wiley.com/doi/book/10.1002/9781119818984Copies:
Available:*
Library | Material Type | Item Barcode | Shelf Number | Status | Item Holds |
|---|---|---|---|---|---|
Searching... | E-Book | 596749-1001 | QC88 | Searching... | Searching... |