Title:
Precision measurement of microwave thermal noise
Author:
Randa, James, author.
ISBN:
9781119910121
9781119910114
9781119910107
Physical Description:
1 online resource : illustrations (some color)
Contents:
Cover -- Title Page -- Copyright -- Contents -- Preface -- Chapter 1 Background -- 1.1 Nyquist's Theorem and Noise Temperature -- 1.1.1 Nyquist's Theorem -- 1.1.2 Limits and Numbers -- 1.1.3 Definition of Noise Temperature -- 1.1.4 Excess Noise Ratio and T0 -- 1.2 Microwave Networks -- 1.2.1 Notation -- 1.2.2 Noise Correlation Matrix and Bosma's Theorem -- 1.2.3 Power Ratios -- 1.2.4 Noise-Temperature Translation Through a Passive Device -- References -- References -- Chapter 2 Noise-Temperature Standards -- 2.1 Introduction -- 2.2 Ambient Standards -- 2.3 Hot (Oven) Standards -- 2.4 Cryogenic Standards -- 2.4.1 Coaxial Standards -- 2.4.2 Waveguide Standards -- 2.5 Other Standards and Noise Sources -- 2.5.1 Tunable Primary Standards -- 2.5.2 "Equivalent Hot Standard" Based on RF Power -- 2.5.3 Secondary Standards -- 2.5.4 Synthetic Primary Standards -- References -- Chapter 3 Noise-Temperature Measurement -- 3.1 Background -- 3.2 Total-Power Radiometer -- 3.2.1 Idealized Case -- 3.2.2 Nonideal Case -- 3.2.3 Radiometer Equation for Isolated Total-Power Radiometer -- 3.2.4 Total-Power Radiometer Design -- 3.2.5 Radiometer Testing -- 3.3 Total-Power Radiometer Uncertainties -- 3.3.1 Type-A Uncertainties -- 3.3.2 Type-B Uncertainties -- 3.3.3 Sample Results -- 3.4 Other Radiometer Designs -- 3.4.1 Switching or Dicke Radiometer -- 3.4.2 Digital Radiometer -- 3.5 Measurements through Adapters -- 3.6 Traceability and Inter-laboratory Comparisons -- References -- Chapter 4 Amplifier Noise -- 4.1 Noise Figure, Effective Input Noise Temperature -- 4.2 Noise-Temperature Definition Revisited -- 4.3 Noise Figure Measurement, Simple Case -- 4.4 Definition of Noise Parameters -- 4.4.1 Circuit Treatment of Noisy Amplifier -- 4.4.2 Wave Representation of Noise Parameters -- 4.5 Measurement of Noise Parameters -- 4.5.1 General Measurement Setup.
4.5.2 Fit to Noise-Figure Parameterization -- 4.5.3 Fit to Noise-Temperature or Power Parameterization -- 4.5.4 Possible Variations When Using the Wave Formulation -- 4.5.5 Choice of Input Terminations -- 4.5.6 Commercial Systems, Source-Pull Measurements -- 4.5.7 Frequency-Variation Method -- 4.6 Uncertainty Analysis for Noise-Parameter Measurements -- 4.6.1 Simple Considerations -- 4.6.2 Full Analysis -- 4.6.3 Input Uncertainties -- 4.6.4 General Features and Sample Results -- 4.7 Simulations and Strategies -- References -- Chapter 5 On-Wafer Noise Measurements -- 5.1 Introduction -- 5.2 On-Wafer Microwave Formalism -- 5.2.1 Traveling Waves vs. Pseudo Waves -- 5.2.2 On-Wafer Reference Planes -- 5.3 Noise-Temperature Measurements -- 5.4 On-Wafer Noise-Parameter Measurements -- 5.4.1 General -- 5.4.2 Radiometer-Based Systems -- 5.4.3 Commercial Systems and Reference-Plane Considerations -- 5.4.4 "Enhanced" or Model-Assisted Measurements -- 5.5 Uncertainties -- 5.5.1 Differences from Packaged Amplifiers -- 5.5.2 General Features and Properties -- 5.5.3 Measurement Strategies -- References -- Chapter 6 Noise-Parameter Checks and Verification -- 6.1 Measurement of Passive or Previously Measured Devices -- 6.2 Physical Bounds and Model Predictions -- 6.3 Tandem or Hybrid Measurements -- References -- Chapter 7 Cryogenic Amplifiers -- 7.1 Background -- 7.1.1 Introduction -- 7.1.2 Vacuum-Fluctuation Contribution -- 7.2 Measurement of the Matched Noise Figure -- 7.2.1 Cold-Attenuator Method -- 7.2.2 Internal Hot-Cold Method -- 7.2.3 Full-Characterization Measurements -- 7.3 Noise-Parameter Measurement -- References -- Chapter 8 Multiport Amplifiers -- 8.1 Introduction -- 8.2 Formalism and Noise Matrix -- 8.3 Definition of Noise Figure for Multiports -- 8.4 Degradation of Signal-to-Noise Ratio.
Abstract:
Precision Measurement of Microwave Comprehensive resource covering the foundations and analysis of precision noise measurements with a detailed treatment of their uncertainties Precision Measurement of Microwave Thermal Noise presents the basics of precise measurements of thermal noise at microwave frequencies and guides readers through how to evaluate the uncertainties in such measurement. The focus is on measurement methods used at the U.S. National Institute of Standards and Technology (NIST), but the general principles and methods are useful in a wide range of applications. Readers will learn how to perform accurate microwave noise measurements using the respected author's expertise of calculations to aid understanding of the challenges and solutions. The text covers the background required for the analysis of the measurements and the standards employed to calibrate radiofrequency and microwave radiometers. It also covers measurements of noise temperature (power) and the noise characteristics of amplifiers and transistors. In addition to the usual room-temperature two-port devices, cryogenic devices and multiport amplifiers are also discussed. Finally, the connection of these lab-based measurements to remote-sensing measurement (especially from space) is considered, and possible contributions of the lab-based measurements to remote-sensing applications are discussed. Specific topics and concepts covered in the text include: * Noise-temperature standards, covering ambient standards, hot (oven) standards, cryogenic standards, and other standards and noise sources * Amplifier noise, covering definition of noise parameters, measurement of noise parameters, uncertainty analysis for noise-parameter measurements, and simulations and strategies * On-wafer noise measurements, covering on-wafer microwave formalism, noise temperature, on-wafer noise-parameter measurements, and uncertainties * Multiport amplifiers, covering formalism and noise matrix, definition of noise figure for multiports, and degradation of signal-to-noise ratio Containing some introductory material, Precision Measurement of Microwave Thermal Noise is an invaluable resource on the subject for advanced students and all professionals working in (or entering) the field of microwave noise measurements, be it in a standards lab, a commercial lab, or academic research.
Local Note:
John Wiley and Sons
Electronic Access:
https://onlinelibrary.wiley.com/doi/book/10.1002/9781119910107Copies:
Available:*
Library | Material Type | Item Barcode | Shelf Number | Status | Item Holds |
|---|---|---|---|---|---|
Searching... | E-Book | 597974-1001 | TK7876 .R36 2023 | Searching... | Searching... |