Physical Principles of Electron Microscopy An Introduction to TEM, SEM, and AEM

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Title:

Author:

Egerton, Ray F. author.

ISBN:

9780387260167

Physical Description:

XII, 202 p. 122 illus. online resource.

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Library	Material Type	Item Barcode	Shelf Number	Status	Item Holds
Searching... Online Library	E-Book	165220-2001	ONLINE	Searching... Unknown	Searching... Unavailable