Title:
Data Mining and Diagnosing IC Fails
Author:
Huisman, Leendert M. author.
ISBN:
9780387263519
Physical Description:
XIX, 250 p. online resource.
Series:
Frontiers in Electronic Testing, 31
Series Title:
Frontiers in Electronic Testing, 0929-1296 ; 31
Added Corporate Author:
Electronic Access:
http://dx.doi.org/10.1007/b137446Copies:
Available:*
Library | Material Type | Item Barcode | Shelf Number | Status | Item Holds |
|---|---|---|---|---|---|
Searching... | E-Book | 165270-2001 | ONLINE | Searching... | Searching... |