Cover image for Data Mining and Diagnosing IC Fails
Title:
Data Mining and Diagnosing IC Fails
Author:
Huisman, Leendert M. author.
ISBN:
9780387263519
Physical Description:
XIX, 250 p. online resource.
Series:
Frontiers in Electronic Testing, 31
Series Title:
Frontiers in Electronic Testing, 0929-1296 ; 31
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E-Book 165270-2001 ONLINE
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