Atomic Force Microscopy, Scanning Nearfield Optical Microscopy and Nanoscratching Application to Rough and Natural Surfaces

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Title:

Author:

Kaupp, Gerd. author.

ISBN:

9783540284727

Physical Description:

XII, 292 p. 239 illus. online resource.

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Library	Material Type	Item Barcode	Shelf Number	Status	Item Holds
Searching... Online Library	E-Book	181752-2001	ONLINE	Searching... Unknown	Searching... Unavailable