Lock-in Thermography Basics and Use for Evaluating Electronic Devices and Materials

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Title:

Author:

Breitenstein, Otwin. author.

ISBN:

9783642024177

Physical Description:

X, 258 p. online resource.

Series:

Springer Series in Advanced Microelectronics, 10

Series Title:

Springer Series in Advanced Microelectronics, 1437-0387 ; 10

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Library	Material Type	Item Barcode	Shelf Number	Status	Item Holds
Searching... Online Library	E-Book	190315-2001	ONLINE	Searching... Unknown	Searching... Unavailable