Cover image for Logic testing and design for testability
Title:
Logic testing and design for testability
Author:
Fujiwara, Hideo.
ISBN:
9780262256186
Publication Information:
Cambridge, Mass. : MIT Press, c1985.
Physical Description:
1 online resource (x, 284 p.) : ill.
Series:
MIT Press series in computer systems
Series Title:
MIT Press series in computer systems
Subject Term:
Logic circuits -- Testing.

Integrierte Schaltung.

Test.

VLSI.
Electronic Access:
IEEE Xplore http://ieeexplore.ieee.org/xpl/bkabstractplus.jsp?bkn=6267264
Holds:
Copies:

Available:*

Library
Material Type
Item Barcode
Shelf Number
Status
Item Holds
Searching...
 E-Book 220153-1001 ONLINE
Searching...

On Order