Title:
Semiconductor strain metrology principles and applications
Author:
Wong, Terence K. S.
ISBN:
9781608053599
Publication Information:
[Saif Zone, Sharjah, U.A.E] ; Oak Park, IL : Bentham Science, [2012]
Physical Description:
1 online resource (136 p. :) ill.
Electronic Access:
EBSCOhost http://search.ebscohost.com/login.aspx?direct=true&scope=site&db=nlebk&db=nlabk&AN=500610Copies:
Available:*
Library | Material Type | Item Barcode | Shelf Number | Status | Item Holds |
|---|---|---|---|---|---|
Searching... | E-Book | 280205-1001 | ONLINE | Searching... | Searching... |