Title:
Amplitude modulation atomic force microscopy
Author:
Castro García, Ricardo.
ISBN:
9783527632183
9783527632190
Publication Information:
Weinheim : Wiley-VCH ; Chichester : John Wiley [distributor], 2010.
Physical Description:
1 online resource (xiv, 179 p.) : ill.
Added Corporate Author:
Electronic Access:
John Wiley http://dx.doi.org/10.1002/9783527632183Books24x7 http://www.books24x7.com/marc.asp?bookid=43158
Copies:
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