Cover image for Electromigration Modeling at Circuit Layout Level
Title:
Electromigration Modeling at Circuit Layout Level
Author:
Tan, Cher Ming. author.
ISBN:
9789814451215
Physical Description:
IX, 103 p. 75 illus., 2 illus. in color. online resource.
Series:
SpringerBriefs in Applied Sciences and Technology,
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E-Book 336507-1001 ONLINE(336507.1)
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