Cover image for Built-in Fault-Tolerant Computing Paradigm for Resilient Large-Scale Chip Design A Self-Test, Self-Diagnosis, and Self-Repair-Based Approach
Title:
Built-in Fault-Tolerant Computing Paradigm for Resilient Large-Scale Chip Design A Self-Test, Self-Diagnosis, and Self-Repair-Based Approach
Author:
Li, Xiaowei. author.
ISBN:
9789811985515
Edition:
1st ed. 2023.
Physical Description:
XVIII, 304 p. 1 illus. online resource.
Contents:
Chapter 1: Introduction -- Chapter 2: Fault-tolerant general circuits with 3S -- Chapter 3: Fault-tolerant general purposed processors with 3S -- Chapter 4: Fault-tolerant network-on-chip with 3S -- Chapter 5: Fault-tolerant deep learning processors with 3S -- Chapter 6: Conclusion.
Added Author:
Yan, Guihai.

Liu, Cheng.
Added Corporate Author:
SpringerLink (Online service)
Electronic Access:
https://doi.org/10.1007/978-981-19-8551-5
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