Title:
Lifetime Reliability-aware Design of Integrated Circuits
Author:
Raji, Mohsen. author.
ISBN:
9783031153457
Edition:
1st ed. 2023.
Physical Description:
XIII, 107 p. 31 illus., 13 illus. in color. online resource.
Contents:
1. Impacts of Process Variations and Aging on Lifetime Reliability of Flip-Flops -- 2 Restructuring-based Lifetime Reliability Improvement of Nano-scale Master-Slave Flip-Flops -- 3 Lifetime Reliability Improvement of Pulsed Flip-Flops -- 4 Gate Sizing-based Lifetime Reliability Improvement of Integrated Circuits -- 5 Joint Timing Yield and Lifetime Reliability Optimization of Integrated Circuits -- 6 Lifetime Reliability Optimization Algorithms of Integrated Circuits using Dual Threshold Voltage Assignment.
Added Author:
Added Corporate Author:
Electronic Access:
https://doi.org/10.1007/978-3-031-15345-7Copies:
Available:*
Library | Material Type | Item Barcode | Shelf Number | Status | Item Holds |
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Searching... | E-Book | 527089-1001 | ONLINE | Searching... | Searching... |