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169. 
Cover image for Design-for-Test and Test Optimization Techniques for TSV-based 3D Stacked ICs
Design-for-Test and Test Optimization Techniques for TSV-based 3D Stacked ICs
Author 
Noia, Brandon. author. Chakrabarty, Krishnendu. author. SpringerLink (Online service)
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ONLINE
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https://doi.org/10.1007/978-3-319-02378-6
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170. 
Cover image for Exploring Memory Hierarchy Design with Emerging Memory Technologies
Exploring Memory Hierarchy Design with Emerging Memory Technologies
Author 
Sun, Guangyu. author. SpringerLink (Online service)
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https://doi.org/10.1007/978-3-319-00681-9
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171. 
Cover image for Trace-Based Post-Silicon Validation for VLSI Circuits
Trace-Based Post-Silicon Validation for VLSI Circuits
Author 
Liu, Xiao. author. Xu, Qiang. author. SpringerLink (Online service)
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https://doi.org/10.1007/978-3-319-00533-1
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172. 
Cover image for Reliability of High Mobility SiGe Channel MOSFETs for Future CMOS Applications
Reliability of High Mobility SiGe Channel MOSFETs for Future CMOS Applications
Author 
Franco, Jacopo. author. Kaczer, Ben. author. Groeseneken, Guido. author. SpringerLink (Online service)
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https://doi.org/10.1007/978-94-007-7663-0
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173. 
Cover image for ESD : analog circuits and design
ESD : analog circuits and design
Author 
Voldman, Steven H.
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ONLINE(341679.1)
Electronic Access 
John Wiley http://dx.doi.org/10.1002/9781118701409
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174. 
Cover image for Wireless power transfer via radiowaves
Wireless power transfer via radiowaves
Author 
Shinohara, Naoki, 1968- author.
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ONLINE(341917.1)
Electronic Access 
Ebook Library http://public.eblib.com/choice/publicfullrecord.aspx?p=1599324
John Wiley http://dx.doi.org/10.1002/9781118863008
MyiLibrary http://www.myilibrary.com?id=568624
Safari Books Online http://proquest.safaribooksonline.com/?fpi=9781118862964
Volltext http://proquest.tech.safaribooksonline.de/9781118862964
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175. 
Cover image for Beyond-CMOS Nanodevices 1
Beyond-CMOS Nanodevices 1
Author 
Balestra, Francis.
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ONLINE(342103.1)
Electronic Access 
Ebook Library http://public.eblib.com/choice/publicfullrecord.aspx?p=1706877
ebrary http://site.ebrary.com/id/10879744
John Wiley http://dx.doi.org/10.1002/9781118984772
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176. 
Cover image for Beyond-CMOS nanodevices 2
Beyond-CMOS nanodevices 2
Author 
Balestra, Francis, editor.
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ONLINE(342107.1)
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ebrary An electronic book accessible through the World Wide Web; click to view
John Wiley http://dx.doi.org/10.1002/9781118985137
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177. 
Cover image for Organic photovoltaics : materials, device physics, and manufacturing technologies
Organic photovoltaics : materials, device physics, and manufacturing technologies
Author 
Brabec, C. J. (Christoph J.), 1966- editor. Scherf, Ullrich, editor. Dʹi͡akonov, Vladimir A., editor. Angmo, Dechan.
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ONLINE(342204.1)
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ebrary http://alltitles.ebrary.com/Doc?id=10842269
John Wiley http://dx.doi.org/10.1002/9783527656912
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178. 
Cover image for Interatomic bonding in solids fundamentals, simulation, applications
Interatomic bonding in solids fundamentals, simulation, applications
Author 
Levitin, Valim.
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ONLINE(342212.1)
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John Wiley http://dx.doi.org/10.1002/9783527671557
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179. 
Cover image for Systematische Beurteilung technischer Schadensflle
Systematische Beurteilung technischer Schadensflle
Author 
Pohl, Michael. Lange, Günter.
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ONLINE(342231.1)
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ebrary http://alltitles.ebrary.com/Doc?id=10839246
John Wiley http://dx.doi.org/10.1002/9783527683161
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180. 
Cover image for Silicon-On-Insulator (SOI) Technology Manufacture and Applications.
Silicon-On-Insulator (SOI) Technology Manufacture and Applications.
Author 
Kononchuk, O. Nguyen, B.-Y.
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ONLINE(355710.1)
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ScienceDirect http://www.sciencedirect.com/science/book/9780857095268
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