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Cover image for Advances in Production Management Systems. Production Management Systems for Volatile, Uncertain, Complex, and Ambiguous Environments 43rd IFIP WG 5.7 International Conference, APMS 2024, Chemnitz, Germany, September 8-12, 2024, Proceedings, Part V
Advances in Production Management Systems. Production Management Systems for Volatile, Uncertain, Complex, and Ambiguous Environments 43rd IFIP WG 5.7 International Conference, APMS 2024, Chemnitz, Germany, September 8-12, 2024, Proceedings, Part V
Author 
Thürer, Matthias. editor. (orcid)0000-0002-2705-969X Riedel, Ralph. editor. (orcid)0000-0002-3704-8230 von Cieminski, Gregor. editor. (orcid)0000-0001-9869-5055 Romero, David. editor. (orcid)0000-0003-3610-0751 SpringerLink (Online service)
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https://doi.org/10.1007/978-3-031-71637-9
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14. 
Cover image for SDL 2017: Model-Driven Engineering for Future Internet 18th International SDL Forum, Budapest, Hungary, October 9-11, 2017, Proceedings
SDL 2017: Model-Driven Engineering for Future Internet 18th International SDL Forum, Budapest, Hungary, October 9-11, 2017, Proceedings
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Csöndes, Tibor. editor. Kovács, Gábor. editor. Réthy, György. editor. SpringerLink (Online service)
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https://doi.org/10.1007/978-3-319-68015-6
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15. 
Cover image for Propagation Engineering in Wireless Communications
Propagation Engineering in Wireless Communications
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Ghasemi, Abdollah. author. Abedi, Ali. author. Ghasemi, Farshid. author. SpringerLink (Online service)
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https://doi.org/10.1007/978-3-319-32783-9
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16. 
Cover image for Computers, Software Engineering, and Digital Devices
Computers, Software Engineering, and Digital Devices
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Dorf, Richard C., author. Taylor and Francis.
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TK7885
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17. 
Cover image for Modeling for reliability analysis Markov modeling for reliability, maintainability, safety, and supportability analyses of complex computer systems
Modeling for reliability analysis Markov modeling for reliability, maintainability, safety, and supportability analyses of complex computer systems
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Pukite, Jan, 1928- Pukite, Paul.
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IEEE Xplore http://ieeexplore.ieee.org/xpl/bkabstractplus.jsp?bkn=5263338
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