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13. 
Cover image for Narrow Gap Semiconductors 2007 Proceedings of the 13th International Conference, 8–12 July, 2007, Guildford, UK
Narrow Gap Semiconductors 2007 Proceedings of the 13th International Conference, 8–12 July, 2007, Guildford, UK
Author 
Murdin, Ben. editor. Clowes, Steve. editor. SpringerLink (Online service)
Preferred Shelf Number 
ONLINE
Electronic Access 
http://dx.doi.org/10.1007/978-1-4020-8425-6
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14. 
Cover image for Dilute III-V Nitride Semiconductors and Material Systems Physics and Technology
Dilute III-V Nitride Semiconductors and Material Systems Physics and Technology
Author 
Erol, Ayşe. editor. SpringerLink (Online service)
Preferred Shelf Number 
ONLINE
Electronic Access 
http://dx.doi.org/10.1007/978-3-540-74529-7
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15. 
Cover image for Transport Phenomena and Kinetic Theory Applications to Gases, Semiconductors, Photons, and Biological Systems
Transport Phenomena and Kinetic Theory Applications to Gases, Semiconductors, Photons, and Biological Systems
Author 
Cercignani, Carlo. editor. Gabetta, Ester. editor. SpringerLink (Online service)
Preferred Shelf Number 
ONLINE
Electronic Access 
http://dx.doi.org/10.1007/978-0-8176-4554-0
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16. 
Cover image for Aligned Carbon Nanotubes Physics, Concepts, Fabrication and Devices
Aligned Carbon Nanotubes Physics, Concepts, Fabrication and Devices
Author 
Ren, Zhifeng. author. Lan, Yucheng. author. Wang, Yang. author. SpringerLink (Online service)
Preferred Shelf Number 
ONLINE(333331.1)
Electronic Access 
http://dx.doi.org/10.1007/978-3-642-30490-3
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17. 
Cover image for High Mobility and Quantum Well Transistors Design and TCAD Simulation
High Mobility and Quantum Well Transistors Design and TCAD Simulation
Author 
Hellings, Geert. author. De Meyer, Kristin. author. SpringerLink (Online service)
Preferred Shelf Number 
ONLINE(336218.1)
Electronic Access 
http://dx.doi.org/10.1007/978-94-007-6340-1
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18. 
Cover image for Optically Active Charge Traps and Chemical Defects in Semiconducting Nanocrystals Probed by Pulsed Optically Detected Magnetic Resonance
Optically Active Charge Traps and Chemical Defects in Semiconducting Nanocrystals Probed by Pulsed Optically Detected Magnetic Resonance
Author 
van Schooten, Kipp. author. SpringerLink (Online service)
Preferred Shelf Number 
ONLINE(332776.1)
Electronic Access 
http://dx.doi.org/10.1007/978-3-319-00590-4
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19. 
Cover image for Toward Quantum FinFET
Toward Quantum FinFET
Author 
Han, Weihua. editor. Wang, Zhiming M. editor. SpringerLink (Online service)
Preferred Shelf Number 
ONLINE(332897.1)
Electronic Access 
http://dx.doi.org/10.1007/978-3-319-02021-1
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20. 
Cover image for FIB Nanostructures
FIB Nanostructures
Author 
Wang, Zhiming M. editor. SpringerLink (Online service)
Preferred Shelf Number 
ONLINE(332951.1)
Electronic Access 
http://dx.doi.org/10.1007/978-3-319-02874-3
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21. 
Cover image for High-Performance D/A-Converters Application to Digital Transceivers
High-Performance D/A-Converters Application to Digital Transceivers
Author 
Clara, Martin. author. SpringerLink (Online service)
Preferred Shelf Number 
ONLINE(333409.1)
Electronic Access 
http://dx.doi.org/10.1007/978-3-642-31229-8
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22. 
Cover image for Bismuth-Containing Compounds
Bismuth-Containing Compounds
Author 
Li, Handong. editor. Wang, Zhiming M. editor. SpringerLink (Online service)
Preferred Shelf Number 
ONLINE(332391.1)
Electronic Access 
http://dx.doi.org/10.1007/978-1-4614-8121-8
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23. 
Cover image for Low Dimensional Semiconductor Structures Characterization, Modeling and Applications
Low Dimensional Semiconductor Structures Characterization, Modeling and Applications
Author 
Ünlü, Hilmi. editor. Horing, Norman J. M. editor. SpringerLink (Online service)
Preferred Shelf Number 
ONLINE(333183.1)
Electronic Access 
http://dx.doi.org/10.1007/978-3-642-28424-3
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24. 
Cover image for Delta-Sigma A/D-Converters Practical Design for Communication Systems
Delta-Sigma A/D-Converters Practical Design for Communication Systems
Author 
Gaggl, Richard. author. SpringerLink (Online service)
Preferred Shelf Number 
ONLINE(333863.1)
Electronic Access 
http://dx.doi.org/10.1007/978-3-642-34543-2
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