Limit Search Results
Author
Language
Publication Date
-
Subject
Nanotechnology.
(7)
Optical materials.
(7)
Engineering.
(6)
Nanotechnology and Microengineering.
(6)
Physics.
(6)
Material Type
Shelf Location
Library
Switch to list view
Switch to thumbnail view
31 Results Found Subscribe to search results
000000000000DEFAULT
Print
13. 
Cover image for Low Dimensional Semiconductor Structures Characterization, Modeling and Applications
Low Dimensional Semiconductor Structures Characterization, Modeling and Applications
Author 
Ünlü, Hilmi. editor. Horing, Norman J. M. editor. SpringerLink (Online service)
Preferred Shelf Number 
ONLINE(333183.1)
Electronic Access 
http://dx.doi.org/10.1007/978-3-642-28424-3
Format: 
Availability 
Online Library~1
Available:
Copies:
14. 
Cover image for Aligned Carbon Nanotubes Physics, Concepts, Fabrication and Devices
Aligned Carbon Nanotubes Physics, Concepts, Fabrication and Devices
Author 
Ren, Zhifeng. author. Lan, Yucheng. author. Wang, Yang. author. SpringerLink (Online service)
Preferred Shelf Number 
ONLINE(333331.1)
Electronic Access 
http://dx.doi.org/10.1007/978-3-642-30490-3
Format: 
Availability 
Online Library~1
Available:
Copies:
15. 
Cover image for The GEC Research Laboratories 1919-1984
The GEC Research Laboratories 1919-1984
Author 
Clayton, Robert Bowers, B., ed. Algar, Joan GEC Research Laboratories
Preferred Shelf Number 
ONLINE
Electronic Access 
http://dx.doi.org/10.1049/PBHT010E
Format: 
Availability 
Online Library~1
Available:
Copies:
16. 
Cover image for Bonds and bands in semiconductors
Bonds and bands in semiconductors
Author 
Phillips, J. C.
Preferred Shelf Number 
ONLINE
Electronic Access 
ScienceDirect http://www.sciencedirect.com/science/book/9780125533508
Format: 
Availability 
Online Library~1
Available:
Copies:
17. 
Cover image for Production Planning and Control in Semiconductor Manufacturing Big Data Analytics and Industry 4.0 Applications
Production Planning and Control in Semiconductor Manufacturing Big Data Analytics and Industry 4.0 Applications
Author 
Chen, Tin-Chih Toly. author. SpringerLink (Online service)
Preferred Shelf Number 
ONLINE
Electronic Access 
https://doi.org/10.1007/978-3-031-14065-5
Format: 
Availability 
Online Library~1
Available:
Copies:
18. 
Cover image for Feature Profile Evolution in Plasma Processing Using On-wafer Monitoring System
Feature Profile Evolution in Plasma Processing Using On-wafer Monitoring System
Author 
Samukawa, Seiji. author. SpringerLink (Online service)
Preferred Shelf Number 
ONLINE
Electronic Access 
https://doi.org/10.1007/978-4-431-54795-2
Format: 
Availability 
Online Library~1
Available:
Copies:
19. 
Cover image for Light-Emitting Diodes Materials, Processes, Devices and Applications
Light-Emitting Diodes Materials, Processes, Devices and Applications
Author 
Li, Jinmin. editor. Zhang, G. Q. editor. SpringerLink (Online service)
Preferred Shelf Number 
ONLINE
Electronic Access 
https://doi.org/10.1007/978-3-319-99211-2
Format: 
Availability 
Online Library~1
Available:
Copies:
20. 
Cover image for Toward Quantum FinFET
Toward Quantum FinFET
Author 
Han, Weihua. editor. Wang, Zhiming M. editor. SpringerLink (Online service)
Preferred Shelf Number 
ONLINE(332897.1)
Electronic Access 
http://dx.doi.org/10.1007/978-3-319-02021-1
Format: 
Availability 
Online Library~1
Available:
Copies:
21. 
Cover image for FIB Nanostructures
FIB Nanostructures
Author 
Wang, Zhiming M. editor. SpringerLink (Online service)
Preferred Shelf Number 
ONLINE(332951.1)
Electronic Access 
http://dx.doi.org/10.1007/978-3-319-02874-3
Format: 
Availability 
Online Library~1
Available:
Copies:
22. 
Cover image for Quantum dot lasers
Quantum dot lasers
Author 
Ustinov, Victor M. (Victor Mikhailovich)
Preferred Shelf Number 
ONLINE
Electronic Access 
Oxford scholarship online http://dx.doi.org/10.1093/acprof:oso/9780198526797.001.0001
Format: 
Availability 
Online Library~1
Available:
Copies:
23. 
Cover image for Silicon-based photonics
Silicon-based photonics
Author 
Kasper, Erich, author. Yu, Jinzhong, 1943- author.
Preferred Shelf Number 
TK7871.15 .S55 K37 2021
Electronic Access 
Taylor & Francis https://www.taylorfrancis.com/books/9781315156514
OCLC metadata license agreement http://www.oclc.org/content/dam/oclc/forms/terms/vbrl-201703.pdf
Format: 
Availability 
Online Library~1
Available:
Copies:
24. 
Cover image for CMOS Test and Evaluation A Physical Perspective
CMOS Test and Evaluation A Physical Perspective
Author 
Bhushan, Manjul. author. Ketchen, Mark B. author. SpringerLink (Online service)
Preferred Shelf Number 
ONLINE
Electronic Access 
https://doi.org/10.1007/978-1-4939-1349-7
Format: 
Availability 
Online Library~1
Available:
Copies:
Go to:Search Results
|
Top of Page
|
Search Facets