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13. 
Cover image for Light Scattering in Solid IX
Light Scattering in Solid IX
Author 
Cardona, Manuel. editor. Merlin, Roberto. editor. SpringerLink (Online service)
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http://dx.doi.org/10.1007/b14231
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14. 
Cover image for Applied Scanning Probe Methods V Scanning Probe Microscopy Techniques
Applied Scanning Probe Methods V Scanning Probe Microscopy Techniques
Author 
Bhushan, Bharat. editor. Kawata, Satoshi. editor. Fuchs, Harald. editor. SpringerLink (Online service)
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http://dx.doi.org/10.1007/978-3-540-37316-2
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15. 
Cover image for Applied Scanning Probe Methods VI Characterization
Applied Scanning Probe Methods VI Characterization
Author 
Bhushan, Bharat. editor. Kawata, Satoshi. editor. SpringerLink (Online service)
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http://dx.doi.org/10.1007/11776314
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16. 
Cover image for Applied Scanning Probe Methods VII Biomimetics and Industrial Applications
Applied Scanning Probe Methods VII Biomimetics and Industrial Applications
Author 
Bhushan, Bharat. editor. Fuchs, Harald. editor. SpringerLink (Online service)
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http://dx.doi.org/10.1007/11785705
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17. 
Cover image for Very High Resolution Photoelectron Spectroscopy
Very High Resolution Photoelectron Spectroscopy
Author 
Hüfner, Stefan. editor. SpringerLink (Online service)
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http://dx.doi.org/10.1007/3-540-68133-7
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18. 
Cover image for Scanning Probe Microscopy Electrical and Electromechanical Phenomena at the Nanoscale
Scanning Probe Microscopy Electrical and Electromechanical Phenomena at the Nanoscale
Author 
Kalinin, Sergei. editor. Gruverman, Alexei. editor. SpringerLink (Online service)
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http://dx.doi.org/10.1007/978-0-387-28668-6
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19. 
Cover image for Fundamentals of Nanoscale Film Analysis
Fundamentals of Nanoscale Film Analysis
Author 
Alford, Terry L. author. Feldman, Leonard C. author. Mayer, James W. author. SpringerLink (Online service)
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http://dx.doi.org/10.1007/978-0-387-29261-8
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20. 
Cover image for Micro- and Opto-Electronic Materials and Structures: Physics, Mechanics, Design, Reliability, Packaging
Micro- and Opto-Electronic Materials and Structures: Physics, Mechanics, Design, Reliability, Packaging
Author 
Suhir, E. editor. Lee, Y. C. editor. Wong, C. P. editor. SpringerLink (Online service)
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http://dx.doi.org/10.1007/0-387-32989-7
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21. 
Cover image for Micromachined Thin-Film Sensors for SOI-CMOS Co-Integration
Micromachined Thin-Film Sensors for SOI-CMOS Co-Integration
Author 
Laconte, J. author. Flandre, D. author. Raskin, J. -P. author. SpringerLink (Online service)
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http://dx.doi.org/10.1007/0-387-28843-0
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22. 
Cover image for Planewaves, Pseudopotentials and the LAPW Method
Planewaves, Pseudopotentials and the LAPW Method
Author 
Singh, David J. author. Nordström, Lars. author. SpringerLink (Online service)
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http://dx.doi.org/10.1007/978-0-387-29684-5
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23. 
Cover image for Scanning Probe Microscopy Atomic Scale Engineering by Forces and Currents
Scanning Probe Microscopy Atomic Scale Engineering by Forces and Currents
Author 
Foster, Adam. author. Hofer, Werner. author. SpringerLink (Online service)
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http://dx.doi.org/10.1007/0-387-37231-8
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24. 
Cover image for Handbook of Applied Solid State Spectroscopy
Handbook of Applied Solid State Spectroscopy
Author 
Vij, D. R. editor. SpringerLink (Online service)
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http://dx.doi.org/10.1007/0-387-37590-2
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