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Library: Beytepe Library

Author

Bishop, Christopher M.

(3)

Stork, David G.

(3)

Duda, Richard O.

(2)

Hart, Peter E. (Peter Elliot), 1941-

(2)

Theodoridis, Sergios, 1951-

(2)

(1)

Andrews, Harry C.

(1)

Arslan, Hasan Basri.

(1)

Banks, Stephen P.

(1)

Bessiere, Pierre.

(1)

Bezdek, C. J., ed.

(1)

(1)

Bongard, Mikhail Moiseevich.

(1)

Bow, Sing-Tze, 1924-

(1)

Calvert, Thomas W., ort. yaz.

(1)

(1)

Chhabra, Atul K., ed.

(1)

Copsey, Keith D.

(1)

Cyganek, Bogusław.

(1)

(1)

(1)

(1)

Fu, King Sun, Date.

(1)

Fukunaga, Keinosuke.

(1)

Ghosh, Ashish, 1966-

(1)

Girolami, Mark, 1963-

(1)

Hawkins, Joseph K., ed.

(1)

International Workshop on Graphics Recognition (3rd : 1999 : Jaipur, India)

(1)

Ioffe, Iosif Isaevich.

(1)

Japan_U.S. Seminar on the learning Process in Control Systems,Nagoya, Japan, 1970.

(1)

Kanal, Laveen N.

(1)

Koutroumbas, Konstantinos, 1967-

(1)

Krishnaiah, Paruchuri R.

(1)

Kuncheva, Ludmila I.

(1)

Marques de Sá, Joaquim P.

(1)

Mather, Paul M.

(1)

Pakhira, Malay K.

(1)

Pal, S. K., ed.

(1)

(1)

Patrick, Edward A., 1937-

(1)

Reinhard, Erik, 1968-

(1)

Rogers, Simon, 1979-

(1)

Scarborough, David.

(1)

Sklansky, Jack.

(1)

Somers, Mark John.

(1)

Theodoridis, Sergios, 1951- Pattern recognition.

(1)

(1)

(1)

(1)

Webb, Andrew R.

(1)

Wille, Luc T, ed.

(1)

(1)

Yom-Tov, Elad, ort. yaz.

(1)

Young, Tzay Y., 1933-

(1)

Yıldırım, Hakan.

(1)

Zhang, David, 1949-

(1)

Language

(41)

(2)

(1)

Publication Date

-

(5)

(3)

(3)

(3)

(3)

(2)

(2)

(2)

(2)

(2)

(2)

(2)

(2)

(2)

(1)

(1)

(1)

(1)

(1)

(1)

(1)

(1)

(1)

(1)

Subject

Pattern recognition systems.

(14)

ÖRÜNTÜ ALGISI.

(7)

Image processing -- Digital techniques.

(4)

Pattern perception.

(4)

Identification -- Automation.

(3)

Machine learning.

(3)

Pattern perception -- Statistical methods.

(3)

Örüntü tanıma sistemleri.

(3)

Biometric identification.

(2)

Biyometrik kimliklendirme.

(2)

Computer vision.

(2)

Image processing.

(2)

Optical pattern recognition.

(2)

Statistical decision.

(2)

Statistical physics.

(2)

Tanı -- Otomasyon.

(2)

ÖZÖRGÜTLEME SİSTEMLERİ.

(2)

Örnek tanıma sistemleri.

(2)

İSTATİSTİKİ FİZİK.

(2)

(1)

Algebras, Linear.

(1)

Bayesian statistical decision theory -- Data processing.

(1)

Bilgisayarlı görüntü sistemleri.

(1)

(1)

BİLGİSAYAR GRAFİKLERİ -- KONGRELER.

(1)

(1)

Cebir, Doğrusal.

(1)

Cluster analysis.

(1)

Computer graphics -- Congresses.

(1)

Computer programming.

(1)

Computer simulation.

(1)

DEMET ANALİZİ.

(1)

(1)

Decision making -- Mathematical models.

(1)

Discriminant analysis.

(1)

FUZZY KÜMELER.

(1)

GÖRSEL ALGILAMA SİSTEMLERİ.

(1)

GÖRÜNTÜ ANALİZİ -- KONGRELER.

(1)

GÖRÜNTÜ İŞLEME -- SAYISAL TEKNİKLER -- KONGRELER.

(1)

GÖRÜNTÜ İŞLEME -- SAYISAL TEKNİKLER.

(1)

Görüntü işleme -- Sayısal teknikler.

(1)

Görüntü işleme.

(1)

Image analysis -- Congresses.

(1)

Image processing -- Digital techniques -- Congresses.

(1)

(1)

KİMYA, ANALİTİK -- VERİ İŞLEM.

(1)

MATEMATİKİ DİLBİLİM.

(1)

Makine Bilgisi.

(1)

Mathematical models.

(1)

Mathematical statistics.

(1)

Metin işleme (Bilgisayar bilimi)

(1)

Neural networks (Computer science)

(1)

Neural networks (Computer science).

(1)

Numerical analysis.

(1)

OPTİK DESEN TANIMASI.

(1)

OPTİK ÖRNEK TANIMA.

(1)

Optik desen tanıması.

(1)

Organizational behavior -- Research -- Methodology.

(1)

Pattern recognition systems -- Congresses.

(1)

Pattern recognition systems -- Data processing.

(1)

Pattern recognition systems -- Mathematical models.

(1)

Pattern recognition systems -- Mathematics.

(1)

Police -- Turkey.

(1)

Polis -- Türkiye.

(1)

Remote sensing.

(1)

(1)

Sinirsel Ağlar (Bilgisayar Bilimi).

(1)

Sinirsel ağlar (Bilgisayar bilimi)

(1)

Soft computing.

(1)

Statistical decision -- Data processing.

(1)

Text processing (Computer science)

(1)

Uzaktan algılama.

(1)

(1)

(1)

ÖRÜNTÜ ALGILAMA SİSTEMLERİ -- KONGRELER.

(1)

ÖRÜNTÜ ALGILAMA SİSTEMLERİ.

(1)

ÖZDEŞLEŞME -- OTOMASYON.

(1)

Örgütsel Davranış -- Araştırma -- Yöntembilim.

(1)

Örnek tanıma sistemleri -- Matematiksel modeller.

(1)

Örüntü algılama -- İstatistiksel metodlar.

(1)

Örüntü algılama sistemleri -- Veri işlem.

(1)

Örüntü algılama sistemleri.

(1)

Örüntü algısı.

(1)

İstatistiki karar.

(1)

İstatistiksel karar -- Veri işlem.

(1)

Material Type

Shelf Location

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13.

Cover image for Pattern recognition and machine learning

Pattern recognition and machine learning

Pattern recognition and machine learning

Author

Bishop, Christopher M.

Preferred Shelf Number

Q327 B52 2006

Format:

Availability

Beytepe Library~2

Available:
Copies:

14.

Cover image for Neural networks for pattern recognition

Neural networks for pattern recognition

Neural networks for pattern recognition

Author

Bishop, Christopher M.

Preferred Shelf Number

QA76.87 .B57 2005

Format:

Availability

Beytepe Library~1

Available:
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15.

Cover image for Pattern recognition and image preprocessing

Pattern recognition and image preprocessing

Pattern recognition and image preprocessing

Author

Bow, Sing-Tze, 1924-

Preferred Shelf Number

TK7882.P3 B69 2002

Format:

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Beytepe Library~1

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Copies:

16.

Cover image for Pattern Recognition : Concepts, Methods and Applications

Pattern Recognition : Concepts, Methods and Applications

Pattern Recognition : Concepts, Methods and Applications

Author

Marques de Sá, Joaquim P.

Preferred Shelf Number

TA1650 M37 2001

Format:

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Beytepe Library~1

Available:
Copies:

17.

Cover image for Syntactic methods in pattern recognition

Syntactic methods in pattern recognition

Syntactic methods in pattern recognition

Author

Fu, King Sun, Date.

Preferred Shelf Number

Q 327 F82 1974

Format:

Availability

Beytepe Library~1

Available:
Copies:

18.

Cover image for Classification, estimation, and pattern recognition

Classification, estimation, and pattern recognition

Classification, estimation, and pattern recognition

Author

Young, Tzay Y., 1933- Calvert, Thomas W., ort. yaz.

Preferred Shelf Number

Q 327 Y68 1973

Format:

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Beytepe Library~1

Available:
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19.

Cover image for Pattern recognition and machine learning : proceedings

Pattern recognition and machine learning : proceedings

Pattern recognition and machine learning : proceedings

Author

Japan_U.S. Seminar on the learning Process in Control Systems,Nagoya, Japan, 1970. Fu, K. S., ed.

Preferred Shelf Number

Q 327 J37 1971

Format:

Availability

Beytepe Library~1

Available:
Copies:

20.

Cover image for Signal processing : image processing and pattern recognition

Signal processing : image processing and pattern recognition

Signal processing : image processing and pattern recognition

Author

Banks, Stephen P.

Preferred Shelf Number

TA 1632 B35 1990

Format:

Availability

Beytepe Library~1

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21.

Cover image for Application of pattern recognition to catalytic research

Application of pattern recognition to catalytic research

Application of pattern recognition to catalytic research

Author

Ioffe, Iosif Isaevich.

Preferred Shelf Number

QD 505 I618 1988

Format:

Availability

Beytepe Library~1

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22.

Cover image for Classification, pattern recognition, and reduction of dimensionality

Classification, pattern recognition, and reduction of dimensionality

Classification, pattern recognition, and reduction of dimensionality

Author

Krishnaiah, Paruchuri R. Kanal, Laveen N.

Preferred Shelf Number

QA278.65 C55 1982

Format:

Availability

Beytepe Library~1

Available:
Copies:

23.

Cover image for Introduction to mathematical techniques in pattern recognition

Introduction to mathematical techniques in pattern recognition

Introduction to mathematical techniques in pattern recognition

Author

Andrews, Harry C.

Preferred Shelf Number

Q 327 A54 1972

Format:

Availability

Beytepe Library~1

Available:
Copies:

24.

Cover image for Matrix methods in data mining and pattern recognition

Matrix methods in data mining and pattern recognition

Matrix methods in data mining and pattern recognition

Author

Elden, Lars.

Preferred Shelf Number

QA76.9.D343 E52 2007

Format:

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