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13. 
Cover image for Reliability and Risk Issues in Large Scale Safety-critical Digital Control Systems
Reliability and Risk Issues in Large Scale Safety-critical Digital Control Systems
Author 
Seong, Poong Hyun. editor. SpringerLink (Online service)
Preferred Shelf Number 
ONLINE
Electronic Access 
http://dx.doi.org/10.1007/978-1-84800-384-2
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14. 
Cover image for Zuverlässigkeit mechatronischer Systeme Grundlagen und Bewertung in frühen Entwicklungsphasen
Zuverlässigkeit mechatronischer Systeme Grundlagen und Bewertung in frühen Entwicklungsphasen
Author 
Bertsche, Bernd. author. Göhner, Peter. author. Jensen, Uwe. author. Schinköthe, Wolfgang. author. Wunderlich, Hans-Joachim. author.
Preferred Shelf Number 
ONLINE
Electronic Access 
http://dx.doi.org/10.1007/978-3-540-85091-5
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15. 
Cover image for Novel Algorithms for Fast Statistical Analysis of Scaled Circuits
Novel Algorithms for Fast Statistical Analysis of Scaled Circuits
Author 
Singhee, Amith. author. Rutenbar, Rob A. author. SpringerLink (Online service)
Preferred Shelf Number 
ONLINE
Electronic Access 
http://dx.doi.org/10.1007/978-90-481-3100-6
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16. 
Cover image for Languages for Embedded Systems and their Applications Selected Contributions on Specification, Design, and Verification from FDL’08
Languages for Embedded Systems and their Applications Selected Contributions on Specification, Design, and Verification from FDL’08
Author 
Radetzki, Martin. editor. SpringerLink (Online service)
Preferred Shelf Number 
ONLINE
Electronic Access 
http://dx.doi.org/10.1007/978-1-4020-9714-0
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17. 
Cover image for Model-based Fault Diagnosis Techniques Design Schemes, Algorithms, and Tools
Model-based Fault Diagnosis Techniques Design Schemes, Algorithms, and Tools
Author 
Ding, Steven X. author. SpringerLink (Online service)
Preferred Shelf Number 
ONLINE
Electronic Access 
http://dx.doi.org/10.1007/978-3-540-76304-8
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18. 
Cover image for Advanced Memory Optimization Techniques for Low-Power Embedded Processors
Advanced Memory Optimization Techniques for Low-Power Embedded Processors
Author 
Verma, Manish. author. Marwedel, Peter. author. SpringerLink (Online service)
Preferred Shelf Number 
ONLINE
Electronic Access 
http://dx.doi.org/10.1007/978-1-4020-5897-4
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19. 
Cover image for Networks and Grids Technology and Theory
Networks and Grids Technology and Theory
Author 
Robertazzi, Thomas G. author. SpringerLink (Online service)
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ONLINE
Electronic Access 
http://dx.doi.org/10.1007/978-0-387-68235-8
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20. 
Cover image for Embedded Systems – Modeling, Technology, and Applications
Embedded Systems – Modeling, Technology, and Applications
Author 
Hommel, Günter. editor. Huanye, Sheng. editor. SpringerLink (Online service)
Preferred Shelf Number 
ONLINE
Electronic Access 
http://dx.doi.org/10.1007/1-4020-4933-1
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21. 
Cover image for Integrated Circuit Test Engineering Modern Techniques
Integrated Circuit Test Engineering Modern Techniques
Author 
Grout, Ian A. author. SpringerLink (Online service)
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ONLINE
Electronic Access 
http://dx.doi.org/10.1007/1-84628-173-3
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22. 
Cover image for Diagnosis and Fault-Tolerant Control
Diagnosis and Fault-Tolerant Control
Author 
Blanke, Mogens. author. Kinnaert, Michel. author. Lunze, Jan. author. Staroswiecki, Marcel. author. SpringerLink (Online service)
Preferred Shelf Number 
ONLINE
Electronic Access 
http://dx.doi.org/10.1007/978-3-540-35653-0
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23. 
Cover image for Control Reconfiguration of Dynamical Systems
Control Reconfiguration of Dynamical Systems
Author 
Steffen, Thomas. author. SpringerLink (Online service)
Preferred Shelf Number 
ONLINE
Electronic Access 
http://dx.doi.org/10.1007/b107072
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24. 
Cover image for Functional Verification of Programmable Embedded Architectures A Top-Down Approach
Functional Verification of Programmable Embedded Architectures A Top-Down Approach
Author 
Mishra, Prabhat. author. Dutt, Nikil D. author. SpringerLink (Online service)
Preferred Shelf Number 
ONLINE
Electronic Access 
http://dx.doi.org/10.1007/b137514
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