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13. 
Cover image for Extreme Statistics in Nanoscale Memory Design
Extreme Statistics in Nanoscale Memory Design
Author 
Singhee, Amith. editor. Rutenbar, Rob A. editor. SpringerLink (Online service)
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ONLINE
Electronic Access 
http://dx.doi.org/10.1007/978-1-4419-6606-3
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14. 
Cover image for Internet networks wired, wireless, and optical technologies
Internet networks wired, wireless, and optical technologies
Author 
Iniewski, Krzysztof.
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ONLINE
Electronic Access 
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15. 
Cover image for Semiconductor radiation detection systems
Semiconductor radiation detection systems
Author 
Iniewski, Krzysztof.
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ONLINE
Electronic Access 
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16. 
Cover image for Radiation effects in semiconductors
Radiation effects in semiconductors
Author 
Iniewski, Krzysztof.
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ONLINE
Electronic Access 
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17. 
Cover image for Digital system verification a combined formal methods and simulation framework
Digital system verification a combined formal methods and simulation framework
Author 
Li, Lun, 1970- Thornton, Mitchell Aaron.
Preferred Shelf Number 
ONLINE
Electronic Access 
EBSCOhost http://search.ebscohost.com/login.aspx?direct=true&scope=site&db=nlebk&db=nlabk&AN=440373
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18. 
Cover image for VLSI micro- and nanophotonics : science, technology, and applications
VLSI micro- and nanophotonics : science, technology, and applications
Author 
Lee, El-Hang.
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ONLINE
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