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13. 
Cover image for Intellectual property and technology standards in China
Intellectual property and technology standards in China
Author 
Altbach, Eric. Project Muse.
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14. 
Cover image for Lean for systems engineering with lean enablers for systems engineering
Lean for systems engineering with lean enablers for systems engineering
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Oppenheim, Bohdan W., 1948- Wiley InterScience (Online service)
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Wiley InterScience An electronic book accessible through the World Wide Web; click for information
Available by subscription from Safari Books Online
http://site.ebrary.com/lib/alltitles/Doc?id=10484797
Volltext http://proquest.tech.safaribooksonline.de/9781118063989
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