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13. 
Cover image for Springer Handbook of Metrology and Testing
Springer Handbook of Metrology and Testing
Author 
Czichos, Horst. editor. Saito, Tetsuya. editor. Smith, Leslie. editor. SpringerLink (Online service)
Preferred Shelf Number 
ONLINE
Electronic Access 
http://dx.doi.org/10.1007/978-3-642-16641-9
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14. 
Cover image for Software metrics and software metrology
Software metrics and software metrology
Author 
Abran, Alain, 1949-
Preferred Shelf Number 
ONLINE
Electronic Access 
IEEE Xplore http://ieeexplore.ieee.org/xpl/bkabstractplus.jsp?bkn=6381791
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15. 
Cover image for Computational Surface and Roundness Metrology
Computational Surface and Roundness Metrology
Author 
Muralikrishnan, Bala. author. Raja, Jay. author. SpringerLink (Online service)
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ONLINE
Electronic Access 
http://dx.doi.org/10.1007/978-1-84800-297-5
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16. 
Cover image for X-ray metrology in semiconductor manufacturing
X-ray metrology in semiconductor manufacturing
Author 
Bowen, D. Keith (David Keith), 1940- Tanner, B. K. (Brian Keith)
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17. 
Cover image for Handbook of silicon semiconductor metrology
Handbook of silicon semiconductor metrology
Author 
Diebold, A. C. (Alain C.)
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18. 
Cover image for Metrology for Fire Experiments in Outdoor Conditions
Metrology for Fire Experiments in Outdoor Conditions
Author 
Silvani, Xavier. author. SpringerLink (Online service)
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ONLINE(332373.1)
Electronic Access 
http://dx.doi.org/10.1007/978-1-4614-7962-8
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19. 
Cover image for Graphene Nanoelectronics Metrology, Synthesis, Properties and Applications
Graphene Nanoelectronics Metrology, Synthesis, Properties and Applications
Author 
Raza, Hassan. editor. SpringerLink (Online service)
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Electronic Access 
http://dx.doi.org/10.1007/978-3-642-22984-8
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20. 
Cover image for Distributed Large-Scale Dimensional Metrology New Insights
Distributed Large-Scale Dimensional Metrology New Insights
Author 
Franceschini, Fiorenzo. author. Galetto, Maurizio. author. Maisano, Domenico. author. Mastrogiacomo, Luca. author. Pralio, Barbara. author.
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http://dx.doi.org/10.1007/978-0-85729-543-9
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21. 
Cover image for Digital holography for MEMS and microsystem metrology
Digital holography for MEMS and microsystem metrology
Author 
Asundi, Anand.
Preferred Shelf Number 
ONLINE
Electronic Access 
John Wiley http://dx.doi.org/10.1002/9781119997290
http://lib.myilibrary.com?id=317798
http://public.eblib.com/EBLPublic/PublicView.do?ptiID=697681
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22. 
Cover image for Advances in speckle metrology and related techniques
Advances in speckle metrology and related techniques
Author 
Kaufmann, Guillermo H.
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ONLINE
Electronic Access 
Wiley InterScience An electronic book accessible through the World Wide Web; click for information
Wiley InterScience - Full Text Online http://onlinelibrary.wiley.com/book/10.1002/9783527633852
http://site.ebrary.com/lib/alltitles/Doc?id=10446636
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23. 
Cover image for Handbook of optical metrology principles and applications
Handbook of optical metrology principles and applications
Author 
Yoshizawa, T?ru, 1939-
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24. 
Cover image for Metrology in industry the key for quality
Metrology in industry the key for quality
Author 
Collège français de métrologie. Wiley InterScience (Online service)
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ONLINE
Electronic Access 
Contributor biographical information http://catdir.loc.gov/catdir/enhancements/fy0806/2006003530-b.html
John Wiley http://dx.doi.org/10.1002/9780470612125
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