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13. 
Cover image for Applied Nonparametric Statistics in Reliability
Applied Nonparametric Statistics in Reliability
Author 
Gámiz, M. Luz. author. Kulasekera, K. B. author. Limnios, Nikolaos. author. Lindqvist, Bo Henry. author. SpringerLink (Online service)
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ONLINE
Electronic Access 
http://dx.doi.org/10.1007/978-0-85729-118-9
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14. 
Cover image for Software Reliability Assessment with OR Applications
Software Reliability Assessment with OR Applications
Author 
Kapur, P.K. author. Pham, Hoang. author. Gupta, A. author. Jha, P.C. author. SpringerLink (Online service)
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http://dx.doi.org/10.1007/978-0-85729-204-9
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15. 
Cover image for Replacement Models with Minimal Repair
Replacement Models with Minimal Repair
Author 
Tadj, Lotfi. editor. Ouali, M.-Salah. editor. Yacout, Soumaya. editor. Ait-Kadi, Daoud. editor. SpringerLink (Online service)
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Electronic Access 
http://dx.doi.org/10.1007/978-0-85729-215-5
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16. 
Cover image for Reliability and Safety of Complex Technical Systems and Processes Modeling – Identification – Prediction - Optimization
Reliability and Safety of Complex Technical Systems and Processes Modeling – Identification – Prediction - Optimization
Author 
Kołowrocki, Krzysztof. author. Soszyńska-Budny, Joanna. author. SpringerLink (Online service)
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http://dx.doi.org/10.1007/978-0-85729-694-8
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17. 
Cover image for Computational Techniques for Structural Health Monitoring
Computational Techniques for Structural Health Monitoring
Author 
Gopalakrishnan, Srinivasan. author. Ruzzene, Massimo. author. Hanagud, Sathyanaraya. author. SpringerLink (Online service)
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http://dx.doi.org/10.1007/978-0-85729-284-1
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18. 
Cover image for Applications of Finite Element Methods for Reliability Studies on ULSI Interconnections
Applications of Finite Element Methods for Reliability Studies on ULSI Interconnections
Author 
Tan, Cher Ming. author. Li, Wei. author. Gan, Zhenghao. author. Hou, Yuejin. author. SpringerLink (Online service)
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http://dx.doi.org/10.1007/978-0-85729-310-7
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19. 
Cover image for Dependability of Networked Computer-based Systems
Dependability of Networked Computer-based Systems
Author 
Verma, Ajit Kumar. author. Ajit, Srividya. author. Kumar, Manoj. author. SpringerLink (Online service)
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http://dx.doi.org/10.1007/978-0-85729-318-3
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20. 
Cover image for The theory and applications of reliability with emphasis on Bayesian and nonparametric methods
The theory and applications of reliability with emphasis on Bayesian and nonparametric methods
Author 
Conference on the Theory and Applications of Reliability with Emphasis on Bayesian and Nonparametric Methods (1975 : University of South Florida) Tsokos, Chris P. Shimi, I. N. United States. Air Force. Office of Scientific Research. University of South Florida.
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ScienceDirect http://www.sciencedirect.com/science/book/9780127021010
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21. 
Cover image for Semiconductor Power Devices Physics, Characteristics, Reliability
Semiconductor Power Devices Physics, Characteristics, Reliability
Author 
Lutz, Josef. author. Schlangenotto, Heinrich. author. Scheuermann, Uwe. author. De Doncker, Rik. author. SpringerLink (Online service)
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http://dx.doi.org/10.1007/978-3-642-11125-9
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22. 
Cover image for Reliability, Maintainability and Risk Practical Methods for Engineers including Reliability Centred Maintenance and Safety-Related Systems.
Reliability, Maintainability and Risk Practical Methods for Engineers including Reliability Centred Maintenance and Safety-Related Systems.
Author 
Smith, David J.
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ScienceDirect http://www.sciencedirect.com/science/book/9780080969022
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23. 
Cover image for Multistate systems reliability theory with applications
Multistate systems reliability theory with applications
Author 
Natvig, Bent, 1946-
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John Wiley http://dx.doi.org/10.1002/9780470977088
http://site.ebrary.com/lib/alltitles/Doc?id=10469650
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24. 
Cover image for Maintaining Mission Critical Systems in a 24/7 Environment
Maintaining Mission Critical Systems in a 24/7 Environment
Author 
Curtis, Peter M., author. Wiley InterScience (Online service)
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IEEE Xplore http://ieeexplore.ieee.org/servlet/opac?bknumber=6047593
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