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13. 
Cover image for Fundamentals of solid-state lighting : LEDs, OLEDs, and their applications in illumination and displays
Fundamentals of solid-state lighting : LEDs, OLEDs, and their applications in illumination and displays
Author 
Khanna, Vinod Kumar, 1952- author.
Preferred Shelf Number 
ONLINE(356980.1)
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14. 
Cover image for Fundamentals of silicon carbide technology : growth, characterization, devices, and applications
Fundamentals of silicon carbide technology : growth, characterization, devices, and applications
Author 
Kimoto, Tsunenobu, 1963- author. Cooper, James A., 1946- author.
Preferred Shelf Number 
ONLINE(341501.1)
Electronic Access 
ebrary An electronic book accessible through the World Wide Web; click to view
John Wiley http://dx.doi.org/10.1002/9781118313534
Safari Books Online http://proquest.safaribooksonline.com/?fpi=9781118313558
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15. 
Cover image for Wireless power transfer via radiowaves
Wireless power transfer via radiowaves
Author 
Shinohara, Naoki, 1968- author.
Preferred Shelf Number 
ONLINE(341917.1)
Electronic Access 
Ebook Library http://public.eblib.com/choice/publicfullrecord.aspx?p=1599324
John Wiley http://dx.doi.org/10.1002/9781118863008
MyiLibrary http://www.myilibrary.com?id=568624
Safari Books Online http://proquest.safaribooksonline.com/?fpi=9781118862964
Volltext http://proquest.tech.safaribooksonline.de/9781118862964
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16. 
Cover image for Beyond-CMOS Nanodevices 1
Beyond-CMOS Nanodevices 1
Author 
Balestra, Francis.
Preferred Shelf Number 
ONLINE(342103.1)
Electronic Access 
Ebook Library http://public.eblib.com/choice/publicfullrecord.aspx?p=1706877
ebrary http://site.ebrary.com/id/10879744
John Wiley http://dx.doi.org/10.1002/9781118984772
MyiLibrary http://www.myilibrary.com?id=621893
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17. 
Cover image for Beyond-CMOS nanodevices 2
Beyond-CMOS nanodevices 2
Author 
Balestra, Francis, editor.
Preferred Shelf Number 
ONLINE(342107.1)
Electronic Access 
ebrary An electronic book accessible through the World Wide Web; click to view
John Wiley http://dx.doi.org/10.1002/9781118985137
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18. 
Cover image for Testing for small-delay defects in nanoscale CMOS integrated circuits
Testing for small-delay defects in nanoscale CMOS integrated circuits
Author 
Goel, Sandeep K, editor of compilation. Chakrabarty, Krishnendu, editor of compilation.
Preferred Shelf Number 
ONLINE(342881.1)
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19. 
Cover image for Integrated power devices and TCAD simulation
Integrated power devices and TCAD simulation
Author 
Fu, Yue (Electrical engineer), author. Li, Zhanming, author. Ng, Wai Tung, author. Sin, Johnny K. O., author.
Preferred Shelf Number 
ONLINE(356761.1)
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20. 
Cover image for Design-for-Test and Test Optimization Techniques for TSV-based 3D Stacked ICs
Design-for-Test and Test Optimization Techniques for TSV-based 3D Stacked ICs
Author 
Noia, Brandon. author. Chakrabarty, Krishnendu. author. SpringerLink (Online service)
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ONLINE
Electronic Access 
https://doi.org/10.1007/978-3-319-02378-6
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21. 
Cover image for MOSFET Technologies for Double-Pole Four-Throw Radio-Frequency Switch
MOSFET Technologies for Double-Pole Four-Throw Radio-Frequency Switch
Author 
Srivastava, Viranjay M. author. Singh, Ghanshyam. author. SpringerLink (Online service)
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https://doi.org/10.1007/978-3-319-01165-3
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22. 
Cover image for Trace-Based Post-Silicon Validation for VLSI Circuits
Trace-Based Post-Silicon Validation for VLSI Circuits
Author 
Liu, Xiao. author. Xu, Qiang. author. SpringerLink (Online service)
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https://doi.org/10.1007/978-3-319-00533-1
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23. 
Cover image for Flash Memories Economic Principles of Performance, Cost and Reliability Optimization
Flash Memories Economic Principles of Performance, Cost and Reliability Optimization
Author 
Richter, Detlev. author. SpringerLink (Online service)
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https://doi.org/10.1007/978-94-007-6082-0
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24. 
Cover image for Bias Temperature Instability for Devices and Circuits
Bias Temperature Instability for Devices and Circuits
Author 
Grasser, Tibor. editor. SpringerLink (Online service)
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ONLINE
Electronic Access 
https://doi.org/10.1007/978-1-4614-7909-3
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