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13. 
Cover image for Theory of Defects in Semiconductors
Theory of Defects in Semiconductors
Author 
Drabold, David A. editor. Estreicher, Stefan K. editor. SpringerLink (Online service)
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ONLINE
Electronic Access 
http://dx.doi.org/10.1007/11690320
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14. 
Cover image for Lateral Aligment of Epitaxial Quantum Dots
Lateral Aligment of Epitaxial Quantum Dots
Author 
Schmidt, Oliver. author. SpringerLink (Online service)
Preferred Shelf Number 
ONLINE
Electronic Access 
http://dx.doi.org/10.1007/978-3-540-46936-0
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15. 
Cover image for Piezoelectric Sensors
Piezoelectric Sensors
Author 
Janshoff, Andreas. editor. Steinem, Claudia. editor. SpringerLink (Online service)
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ONLINE
Electronic Access 
http://dx.doi.org/10.1007/978-3-540-36568-6
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16. 
Cover image for Surface Plasmon Nanophotonics
Surface Plasmon Nanophotonics
Author 
Brongersma, Mark L. editor. Kik, Pieter G. editor. SpringerLink (Online service)
Preferred Shelf Number 
ONLINE
Electronic Access 
http://dx.doi.org/10.1007/978-1-4020-4333-8
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17. 
Cover image for Self-Organized Nanoscale Materials
Self-Organized Nanoscale Materials
Author 
Adachi, Motonari. editor. Lockwood, David J. editor. SpringerLink (Online service)
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ONLINE
Electronic Access 
http://dx.doi.org/10.1007/b137255
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18. 
Cover image for N4-Macrocyclic Metal Complexes
N4-Macrocyclic Metal Complexes
Author 
Zagal, José H. editor. Bedioui, Fethi. editor. Dodelet, Jean-Pol. editor. SpringerLink (Online service)
Preferred Shelf Number 
ONLINE
Electronic Access 
http://dx.doi.org/10.1007/978-0-387-28430-9
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19. 
Cover image for Optical Data Storage Phase-Change Media and Recording
Optical Data Storage Phase-Change Media and Recording
Author 
Meinders, Erwin R. author. Mijiritskii, Andrei V. author. Pieterson, Liesbeth. author. Wuttig, Matthias. author. SpringerLink (Online service)
Preferred Shelf Number 
ONLINE
Electronic Access 
http://dx.doi.org/10.1007/978-1-4020-4217-1
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20. 
Cover image for Atomic Force Microscopy, Scanning Nearfield Optical Microscopy and Nanoscratching Application to Rough and Natural Surfaces
Atomic Force Microscopy, Scanning Nearfield Optical Microscopy and Nanoscratching Application to Rough and Natural Surfaces
Author 
Kaupp, Gerd. author. SpringerLink (Online service)
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ONLINE
Electronic Access 
http://dx.doi.org/10.1007/978-3-540-28472-7
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21. 
Cover image for Surface Plasmon Resonance Based Sensors
Surface Plasmon Resonance Based Sensors
Author 
Homola, Jiří. editor. SpringerLink (Online service)
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ONLINE
Electronic Access 
http://dx.doi.org/10.1007/b100321
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22. 
Cover image for Non-Linear Optical Properties of Matter From Molecules to Condensed Phases
Non-Linear Optical Properties of Matter From Molecules to Condensed Phases
Author 
Papadopoulos, Manthos G. editor. Sadlej, Andrzej J. editor. Leszczynski, Jerzy. editor. SpringerLink (Online service)
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http://dx.doi.org/10.1007/1-4020-4850-5
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23. 
Cover image for Principles and Applications of NanoMEMS Physics
Principles and Applications of NanoMEMS Physics
Author 
Santos, Héctor J. author. SpringerLink (Online service)
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ONLINE
Electronic Access 
http://dx.doi.org/10.1007/b136228
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24. 
Cover image for Ordered Porous Nanostructures and Applications
Ordered Porous Nanostructures and Applications
Author 
Wehrspohn, Ralf B. author. SpringerLink (Online service)
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ONLINE
Electronic Access 
http://dx.doi.org/10.1007/b106900
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