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25. 
Cover image for Deep learning on embedded systems : a hands-on approach using Jetson Nano and Raspberry Pi
Deep learning on embedded systems : a hands-on approach using Jetson Nano and Raspberry Pi
Author 
Arif, Tariq M., author. John Wiley & Sons, publisher.
Preferred Shelf Number 
Q325.73 .A75 2025
Electronic Access 
https://onlinelibrary.wiley.com/doi/book/10.1002/9781394269297
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26. 
Cover image for Next-generation electrochromic devices : from multifunctional materials to smart glasses
Next-generation electrochromic devices : from multifunctional materials to smart glasses
Author 
Cossari, Pierluigi, author.
Preferred Shelf Number 
TA1750 .C67 2025
Electronic Access 
https://onlinelibrary.wiley.com/doi/book/10.1002/9783527832583
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27. 
Cover image for Single element semiconductors : properties and devices
Single element semiconductors : properties and devices
Author 
Shi, Yi (Electrical engineer), author. Yan, Shancheng, author.
Preferred Shelf Number 
TK7871.85 .S55 2025
Electronic Access 
https://onlinelibrary.wiley.com/doi/book/10.1002/9783527851782
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28. 
Cover image for Fundamentals of Electromigration-Aware Integrated Circuit Design
Fundamentals of Electromigration-Aware Integrated Circuit Design
Author 
Lienig, Jens. author. (orcid)0000-0002-2140-4587 Rothe, Susann. author. Thiele, Matthias. author. SpringerLink (Online service)
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ONLINE
Electronic Access 
https://doi.org/10.1007/978-3-031-80023-8
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29. 
Cover image for Micro- and Nano-Systems in 21st-Century Designs, Developments, Applications and Perspective
Micro- and Nano-Systems in 21st-Century Designs, Developments, Applications and Perspective
Author 
Pachkawade, Vinayak. editor. Guha, Koushik. editor. SpringerLink (Online service)
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ONLINE
Electronic Access 
https://doi.org/10.1007/978-981-96-4659-3
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30. 
Cover image for Alternating Current Field Measurement Technique for Detection and Measurement of Cracks in Structures
Alternating Current Field Measurement Technique for Detection and Measurement of Cracks in Structures
Author 
Li, Wei. author. Yuan, Xin'an. author. Zhao, Jianming. author. Yin, Xiaokang. author. Li, Xiao. author.
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ONLINE
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https://doi.org/10.1007/978-981-97-7255-1
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31. 
Cover image for Fundamentals of VHDL for FPGA programming using Vivado
Fundamentals of VHDL for FPGA programming using Vivado
Author 
Pakdel, Majid, author.
Preferred Shelf Number 
TK7885.7
Electronic Access 
https://onlinelibrary.wiley.com/doi/book/10.1002/9781394343126
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32. 
Cover image for Nanometer CMOS ICs From Basics to ASICs
Nanometer CMOS ICs From Basics to ASICs
Author 
Veendrick, Harry. author. SpringerLink (Online service)
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ONLINE
Electronic Access 
https://doi.org/10.1007/978-3-031-64249-4
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33. 
Cover image for Imaging Sensors, Power Management, PLLs and Frequency Synthesizers Advances in Analog Circuit Design 2023
Imaging Sensors, Power Management, PLLs and Frequency Synthesizers Advances in Analog Circuit Design 2023
Author 
Makinwa, Kofi A. A. editor. Baschirotto, Andrea. editor. Nauta, Bram. editor. SpringerLink (Online service)
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ONLINE
Electronic Access 
https://doi.org/10.1007/978-3-031-71559-4
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34. 
Cover image for SOC-Based Solutions in Emerging Application Domains
SOC-Based Solutions in Emerging Application Domains
Author 
Chakravarthi, Veena S. author. (orcid)0000-0002-8703-2376 Koteshwar, Shivananda R. author. (orcid)0000-0003-4299-4069 SpringerLink (Online service)
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ONLINE
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https://doi.org/10.1007/978-3-031-85044-8
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35. 
Cover image for Electrospinning : fundamentals, methods, and applications
Electrospinning : fundamentals, methods, and applications
Author 
Wang, Liming, editor. Qin, Xiaohong, editor.
Preferred Shelf Number 
TA418.9 .F5
Electronic Access 
https://onlinelibrary.wiley.com/doi/book/10.1002/9783527841479
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36. 
Cover image for Linear and nonlinear system modeling
Linear and nonlinear system modeling
Author 
Roy, Tamal, editor. Tripathi, Suman Lata, editor. Ganguli, Souvik, editor.
Preferred Shelf Number 
QA402.3 .L56 2024
Electronic Access 
https://onlinelibrary.wiley.com/doi/book/10.1002/9781119847533
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