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1. 
Cover image for Digital Timing Measurements From Scopes and Probes to Timing and Jitter
Digital Timing Measurements From Scopes and Probes to Timing and Jitter
Author 
Maichen, Wolfgang. author. SpringerLink (Online service)
Preferred Shelf Number 
ONLINE
Electronic Access 
http://dx.doi.org/10.1007/978-0-387-31419-8
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2. 
Cover image for Gizopoulos / Advances in ElectronicTesting
Gizopoulos / Advances in ElectronicTesting
Author 
Gizopoulos, Dimitris. editor. SpringerLink (Online service)
Preferred Shelf Number 
ONLINE
Electronic Access 
http://dx.doi.org/10.1007/0-387-29409-0
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3. 
Cover image for The Core Test Wrapper Handbook Rationale and Application of IEEE Std. 1500™
The Core Test Wrapper Handbook Rationale and Application of IEEE Std. 1500™
Author 
Silva, Francisco. author. McLaurin, Teresa. author. Waayers, Tom. author. SpringerLink (Online service)
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ONLINE
Electronic Access 
http://dx.doi.org/10.1007/0-387-34609-0
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4. 
Cover image for Introduction to Advanced System-on-Chip Test Design and Optimization
Introduction to Advanced System-on-Chip Test Design and Optimization
Author 
Larsson, Erik. author. SpringerLink (Online service)
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ONLINE
Electronic Access 
http://dx.doi.org/10.1007/b135763
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5. 
Cover image for Fault Diagnosis of Analog Integrated Circuits
Fault Diagnosis of Analog Integrated Circuits
Author 
Kabisatpathy, Prithviraj. author. Barua, Alok. author. Sinha, Satyabroto. author. SpringerLink (Online service)
Preferred Shelf Number 
ONLINE
Electronic Access 
http://dx.doi.org/10.1007/b135977
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6. 
Cover image for Data Mining and Diagnosing IC Fails
Data Mining and Diagnosing IC Fails
Author 
Huisman, Leendert M. author. SpringerLink (Online service)
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ONLINE
Electronic Access 
http://dx.doi.org/10.1007/b137446
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7. 
Cover image for Alternating Current Field Measurement Technique for Detection and Measurement of Cracks in Structures
Alternating Current Field Measurement Technique for Detection and Measurement of Cracks in Structures
Author 
Li, Wei. author. Yuan, Xin'an. author. Zhao, Jianming. author. Yin, Xiaokang. author. Li, Xiao. author.
Preferred Shelf Number 
ONLINE
Electronic Access 
https://doi.org/10.1007/978-981-97-7255-1
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8. 
Cover image for Nanometer CMOS ICs From Basics to ASICs
Nanometer CMOS ICs From Basics to ASICs
Author 
Veendrick, Harry. author. SpringerLink (Online service)
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ONLINE
Electronic Access 
https://doi.org/10.1007/978-3-031-64249-4
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9. 
Cover image for Deep learning on embedded systems : a hands-on approach using Jetson Nano and Raspberry Pi
Deep learning on embedded systems : a hands-on approach using Jetson Nano and Raspberry Pi
Author 
Arif, Tariq M., author. John Wiley & Sons, publisher.
Preferred Shelf Number 
Q325.73 .A75 2025
Electronic Access 
https://onlinelibrary.wiley.com/doi/book/10.1002/9781394269297
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10. 
Cover image for Recent Advances in Metrology Select Proceedings of AdMet 2022
Recent Advances in Metrology Select Proceedings of AdMet 2022
Author 
Yadav, Sanjay. editor. (orcid)0000-0002-1450-3202 Garg, Naveen. editor. Aggarwal, Shankar G. editor. (orcid)0000-0002-5809-157X Jaiswal, Shiv Kumar. editor. Kumar, Harish. editor.
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Electronic Access 
https://doi.org/10.1007/978-981-99-4594-8
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11. 
Cover image for Proceedings of the 4th International Conference on Electronics, Biomedical Engineering, and Health Informatics ICEBEHI 2023, 4-5 October, Surabaya, Indonesia
Proceedings of the 4th International Conference on Electronics, Biomedical Engineering, and Health Informatics ICEBEHI 2023, 4-5 October, Surabaya, Indonesia
Author 
Triwiyanto, Triwiyanto. editor. (orcid)0000-0003-3179-8900 Rizal, Achmad. editor. Caesarendra, Wahyu. editor. (orcid)0000-0002-9784-4204 SpringerLink (Online service)
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https://doi.org/10.1007/978-981-97-1463-6
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12. 
Cover image for CdTe and CdZnTe Materials Material Properties and Applications
CdTe and CdZnTe Materials Material Properties and Applications
Author 
Iniewski, Kris. editor. SpringerLink (Online service)
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ONLINE
Electronic Access 
https://doi.org/10.1007/978-3-031-64521-1
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