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13. 
Cover image for Dependability in Electronic Systems Mitigation of Hardware Failures, Soft Errors, and Electro-Magnetic Disturbances
Dependability in Electronic Systems Mitigation of Hardware Failures, Soft Errors, and Electro-Magnetic Disturbances
Author 
Kanekawa, Nobuyasu. author. Ibe, Eishi H. author. Suga, Takashi. author. Uematsu, Yutaka. author. SpringerLink (Online service)
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Electronic Access 
http://dx.doi.org/10.1007/978-1-4419-6715-2
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14. 
Cover image for Simulation and Verification of Electronic and Biological Systems
Simulation and Verification of Electronic and Biological Systems
Author 
Li, Peng. editor. Silveira, Luís Miguel. editor. Feldmann, Peter. editor. SpringerLink (Online service)
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http://dx.doi.org/10.1007/978-94-007-0149-6
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15. 
Cover image for ESL Models and their Application Electronic System Level Design and Verification in Practice
ESL Models and their Application Electronic System Level Design and Verification in Practice
Author 
Bailey, Brian. author. Martin, Grant. author. SpringerLink (Online service)
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http://dx.doi.org/10.1007/978-1-4419-0965-7
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16. 
Cover image for Platform Based Design at the Electronic System Level Industry Perspectives and Experiences
Platform Based Design at the Electronic System Level Industry Perspectives and Experiences
Author 
Burton, Mark. author. Morawiec, Adam. author. SpringerLink (Online service)
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http://dx.doi.org/10.1007/1-4020-5138-7
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17. 
Cover image for Dynamic and Robust Streaming in and between Connected Consumer-Electronic Devices
Dynamic and Robust Streaming in and between Connected Consumer-Electronic Devices
Author 
Stok, Peter. editor. SpringerLink (Online service)
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http://dx.doi.org/10.1007/1-4020-3454-7
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18. 
Cover image for Timing Performance of Nanometer Digital Circuits Under Process Variations
Timing Performance of Nanometer Digital Circuits Under Process Variations
Author 
Champac, Victor. author. Garcia Gervacio, Jose. author. SpringerLink (Online service)
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https://doi.org/10.1007/978-3-319-75465-9
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19. 
Cover image for Models in Hardware Testing Lecture Notes of the Forum in Honor of Christian Landrault
Models in Hardware Testing Lecture Notes of the Forum in Honor of Christian Landrault
Author 
Wunderlich, Hans-Joachim. editor. SpringerLink (Online service)
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http://dx.doi.org/10.1007/978-90-481-3282-9
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20. 
Cover image for CMOS SRAM Circuit Design and Parametric Test in Nano-Scaled Technologies Process-Aware SRAM Design and Test
CMOS SRAM Circuit Design and Parametric Test in Nano-Scaled Technologies Process-Aware SRAM Design and Test
Author 
Pavlov, Andrei. author. Sachdev, Manoj. author. SpringerLink (Online service)
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http://dx.doi.org/10.1007/978-1-4020-8363-1
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21. 
Cover image for New Methods of Concurrent Checking
New Methods of Concurrent Checking
Author 
Göessel, Michael. author. Ocheretny, Vitaly. author. Sogomonyan, Egor. author. Marienfeld, Daniel. author. SpringerLink (Online service)
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http://dx.doi.org/10.1007/978-1-4020-8420-1
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22. 
Cover image for Emerging Nanotechnologies Test, Defect Tolerance, and Reliability
Emerging Nanotechnologies Test, Defect Tolerance, and Reliability
Author 
Tehranipoor, Mohammad. editor. SpringerLink (Online service)
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http://dx.doi.org/10.1007/978-0-387-74747-7
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23. 
Cover image for Defect-Oriented Testing for Nano-Metric CMOS VLSI Circuits 2nd Edition
Defect-Oriented Testing for Nano-Metric CMOS VLSI Circuits 2nd Edition
Author 
Sachdev, Manoj. editor. Gyvez, José Pineda de. editor. SpringerLink (Online service)
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http://dx.doi.org/10.1007/0-387-46547-2
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24. 
Cover image for Digital Timing Measurements From Scopes and Probes to Timing and Jitter
Digital Timing Measurements From Scopes and Probes to Timing and Jitter
Author 
Maichen, Wolfgang. author. SpringerLink (Online service)
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http://dx.doi.org/10.1007/978-0-387-31419-8
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