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13. 
Cover image for Amorphous and heterogeneous silicon thin films : Fundamentals to devices, 1999 : Symposium held April 5-9, 1999, San Francisco, California, U.S.A.
Amorphous and heterogeneous silicon thin films : Fundamentals to devices, 1999 : Symposium held April 5-9, 1999, San Francisco, California, U.S.A.
Author 
Branz, Howard M., ed. Materials Research Society Symposium (1999 : San Francisco, Calif.)
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TK 7871.99.A45 A444 1999
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14. 
Cover image for Selected Topics in Group IV and II-VI Semiconductors Proceedings of Symposium L and Symposium D of the 1995 E-Mrs Spring Conference, Strasbourg, France, 22-26 May 1995
Selected Topics in Group IV and II-VI Semiconductors Proceedings of Symposium L and Symposium D of the 1995 E-Mrs Spring Conference, Strasbourg, France, 22-26 May 1995
Author 
International Symposium on Silicon Molecular Beam Epitaxy (6th : 1995 : Strasbourg, France) Kasper, E.
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ScienceDirect http://www.sciencedirect.com/science/book/9780444824110
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15. 
Cover image for C, H, N and O in Si and Characterization and Simulation of Materials and Processes Proceedings of Symposium N and Symposium G of the 1995 E-Mrs Spring Conference, Held in Strasbourg, France, 22-26 May 1995
C, H, N and O in Si and Characterization and Simulation of Materials and Processes Proceedings of Symposium N and Symposium G of the 1995 E-Mrs Spring Conference, Held in Strasbourg, France, 22-26 May 1995
Author 
Symposium N on Carbon, Hydrogen, Nitrogen, and Oxygen in Silicon and Other Elemental Semiconductors (1995 : Strasbourg, France) Borghesi, A. Symposium G on Atomic Scale Characterization and Simulation of Materials and Processes (1995 : Strasbourg, France)
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16. 
Cover image for Ion implantation technology-92 proceedings of the Ninth International Conference on Ion Implantation Technology, Gainesvile, FL, USA, September 20-24, 1992
Ion implantation technology-92 proceedings of the Ninth International Conference on Ion Implantation Technology, Gainesvile, FL, USA, September 20-24, 1992
Author 
International Conference on Ion Implantation Technology (9th : 1992 : Gainesville, Fla.) Downey, D. F.
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ScienceDirect http://www.sciencedirect.com/science/book/9780444899941
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17. 
Cover image for Semiconductor materials analysis and fabrication process control proceedings of Symposium D on Diagnostic Techniques for Semiconductor Materials Analysis and Fabrication Process Control of the 1992 E-MRS Spring Conference, Strasbourg, France, June 2-5, 1992
Semiconductor materials analysis and fabrication process control proceedings of Symposium D on Diagnostic Techniques for Semiconductor Materials Analysis and Fabrication Process Control of the 1992 E-MRS Spring Conference, Strasbourg, France, June 2-5, 1992
Author 
Symposium D on Diagnostic Techniques for Semiconductor Materials Analysis and Fabrication Process Control (1992 : Strasbourg, France) Crean, G. M. Stuck, R. Woollam, John A. European Materials Research Society.
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18. 
Cover image for Wide-band-gap semiconductors proceedings of the Seventh Trieste ICTP-IUPAP Semiconductor Symposium, International Centre for Theoretical Physics, Trieste, Italy, 8-12 June 1992
Wide-band-gap semiconductors proceedings of the Seventh Trieste ICTP-IUPAP Semiconductor Symposium, International Centre for Theoretical Physics, Trieste, Italy, 8-12 June 1992
Author 
Trieste ICTP-IUPAP Semiconductor Symposium (7th : 1992) Van de Walle, Chris Gilbert.
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ScienceDirect http://www.sciencedirect.com/science/book/9780444815736
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19. 
Cover image for Non-stoichiometry in semiconductors proceedings of Symposium A3 on Non-Stoichiometry in Semiconductors of the International Conference on Advanced Materials--ICAM 91, Strasbourg, France, 27-31 May, 1991
Non-stoichiometry in semiconductors proceedings of Symposium A3 on Non-Stoichiometry in Semiconductors of the International Conference on Advanced Materials--ICAM 91, Strasbourg, France, 27-31 May, 1991
Author 
Symposium A3 on Non-Stoichiometry in Semiconductors (1991 : Strasbourg, France) Bachmann, K. J. Hwang, H.-L. Schwab, C. International Conference on Advanced Materials (1991 : Strasbourg, France)
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20. 
Cover image for Solid state ionics proceedings of Symposium A2 on Solid State Ionics of the International Conference on Advanced Materials--ICAM 91, Strasbourg, France, 27-31 May, 1991
Solid state ionics proceedings of Symposium A2 on Solid State Ionics of the International Conference on Advanced Materials--ICAM 91, Strasbourg, France, 27-31 May, 1991
Author 
Symposium A2 on Solid State Ionics (1991 : Strasbourg, France) Balkanski, Minko, 1927- Takahashi, Takehiko. Tuller, Harry L. International Conference on Advanced Materials (1991 : Strasbourg, France)
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21. 
Cover image for Hot carriers in semiconductor nanostructures physics and applications
Hot carriers in semiconductor nanostructures physics and applications
Author 
Shah, J. (Jagdeep)
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ScienceDirect http://www.sciencedirect.com/science/book/9780126381405
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22. 
Cover image for Hydrogen in semiconductors bulk and surface properties : proceedings of the Sixth Trieste IUPAP-ICTP Semiconductor Symposium, International Centre for Theoretical Physics, Trieste, Italy, 27-31 August 1990
Hydrogen in semiconductors bulk and surface properties : proceedings of the Sixth Trieste IUPAP-ICTP Semiconductor Symposium, International Centre for Theoretical Physics, Trieste, Italy, 27-31 August 1990
Author 
Trieste ICTP-IUPAP Semiconductor Symposium (6th : 1990) Stutzmann, M. (Martin) Chevallier, J. (Jacques)
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23. 
Cover image for Amorphous silicon materials and solar cells, Denver, CO, 1991
Amorphous silicon materials and solar cells, Denver, CO, 1991
Author 
Stafford, Bryon L., ed. American Institute of Physics.
Preferred Shelf Number 
TK 7871.99.A45 A476 1991
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24. 
Cover image for Defect control in semiconductors proceedings of the International Conference on the Science and Technology of Defect Control in Semiconductors, the Yokohama 21st century forum, Yokohama, Japan, September 17-22 1989. Vol. 2
Defect control in semiconductors proceedings of the International Conference on the Science and Technology of Defect Control in Semiconductors, the Yokohama 21st century forum, Yokohama, Japan, September 17-22 1989. Vol. 2
Author 
International Conference on the Science and Technology of Defect Control in Semiconductors (1989 : Yokohama-shi, Japan) Sumino, K. (Kōji), 1931-
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