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25. 
Cover image for Differential evolution fundamentals and applications in electrical engineering
Differential evolution fundamentals and applications in electrical engineering
Author 
Qing, Anyong.
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ONLINE
Electronic Access 
IEEE Xplore http://ieeexplore.ieee.org/xpl/bkabstractplus.jsp?bkn=5361052
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26. 
Cover image for Parallel solution of integral equation-based EM problems in the frequency domain
Parallel solution of integral equation-based EM problems in the frequency domain
Author 
Zhang, Yu, 1978 April 20- Sarkar, Tapan (Tapan K.)
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ONLINE
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IEEE Xplore http://ieeexplore.ieee.org/xpl/bkabstractplus.jsp?bkn=5361038
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27. 
Cover image for Electrostatic discharge understand, simulate and fix ESD problems
Electrostatic discharge understand, simulate and fix ESD problems
Author 
Mardiguian, Michel.
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IEEE Xplore http://ieeexplore.ieee.org/xpl/bkabstractplus.jsp?bkn=5361037
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28. 
Cover image for Reliability wearout mechanisms in advanced CMOS technologies
Reliability wearout mechanisms in advanced CMOS technologies
Author 
Strong, Alvin Wayne, 1946-
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IEEE Xplore http://ieeexplore.ieee.org/xpl/bkabstractplus.jsp?bkn=5361029
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29. 
Cover image for Process identification and PID control
Process identification and PID control
Author 
Sung, Su Whan. Lee, Jietae. Lee, In-Beum, 1955-
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IEEE Xplore http://ieeexplore.ieee.org/xpl/bkabstractplus.jsp?bkn=5361053
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30. 
Cover image for Mobile communication systems and security
Mobile communication systems and security
Author 
Rhee, Man Young.
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ONLINE
Electronic Access 
IEEE Xplore http://ieeexplore.ieee.org/xpl/bkabstractplus.jsp?bkn=5628362
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31. 
Cover image for Systems and software engineering with applications
Systems and software engineering with applications
Author 
Schneidewind, Norman.
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ONLINE
Electronic Access 
IEEE Xplore http://ieeexplore.ieee.org/xpl/bkabstractplus.jsp?bkn=5769539
IEEE Xplore http://ieeexplore.ieee.org/servlet/opac?bknumber=5769539
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32. 
Cover image for Nano-CMOS design for manufacturability robust circuit and physical design for sub-65 nm technology nodes
Nano-CMOS design for manufacturability robust circuit and physical design for sub-65 nm technology nodes
Author 
Wong, Ban P., 1953-
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Click here to view book
Knovel http://app.knovel.com/web/toc.v/cid:kpNCMOSDM2
John Wiley http://dx.doi.org/10.1002/9780470382820
Ebook Library http://public.eblib.com/EBLPublic/PublicView.do?ptiID=413074_0
http://site.ebrary.com/lib/alltitles/Doc?id=10278707
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33. 
Cover image for Biodegradable polymer blends and composites from renewable resources
Biodegradable polymer blends and composites from renewable resources
Author 
Yu, Long.
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ONLINE
Electronic Access 
Knovel http://app.knovel.com/web/toc.v/cid:kpBPBCRR05
John Wiley http://dx.doi.org/10.1002/9780470391501
http://site.ebrary.com/lib/alltitles/Doc?id=10298073
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34. 
Cover image for Mass spectrometry instrumentation, interpretation, and applications
Mass spectrometry instrumentation, interpretation, and applications
Author 
Ekman, Rolf, 1938-
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Electronic Access 
John Wiley http://dx.doi.org/10.1002/9780470395813
http://site.ebrary.com/lib/alltitles/Doc?id=10275653
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35. 
Cover image for Carbon materials for catalysis
Carbon materials for catalysis
Author 
Serp, Philippe. Figueiredo, José Luís. Wiley InterScience (Online service)
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Electronic Access 
John Wiley http://dx.doi.org/10.1002/9780470403709
http://site.ebrary.com/lib/alltitles/Doc?id=10296636
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36. 
Cover image for RF circuit design
RF circuit design
Author 
Li, Richard Chi-Hsi, 1938-
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Books24x7 http://www.books24x7.com/marc.asp?bookid=29688
MyiLibrary, Table of contents http://www.myilibrary.com?id=193857&ref=toc
John Wiley http://dx.doi.org/10.1002/9780470405758
http://site.ebrary.com/lib/alltitles/Doc?id=10263633
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