Search Results for Reliability (Engineering).

|

|

|

|

Remember to clear the cache and close the browser window.

Search Limit

Rooms Restriction Values

8

Search Field

Target Value

Limit Value

Restriction Value

Search For:

Advanced Search

Limit Search Results

Narrowed by:

+

Subject: Reliability (Engineering)

Author

Wiley InterScience (Online service)

(10)

Ayyub, Bilal M., author.

(4)

Dhillon, B. S. (Balbir S.), 1947, author.

(4)

Bayle, Franck, author.

(3)

Delaux, David, editor.

(3)

El Hami, Abdelkhalak, editor.

(3)

Grzeskowiak, Henri, editor.

(3)

Alampalli, Sreenivas.

(2)

(2)

(2)

Curtis, Peter M., author.

(2)

(2)

Dhillon, B. S. (Balbir S.), 1947-

(2)

Dhillon, B. S. (Balbir S.), 1947- author.

(2)

Ghiocel, Dan M.

(2)

McCuen, Richard H., 1941-

(2)

Modarres, M. (Mohammad), author.

(2)

Nikolaidis, Efstratios.

(2)

(2)

Singhal, Suren.

(2)

Ushakov, I. A. (Igorʹ Alekseevich)

(2)

Abbas, Nureddin Mohamed.

(1)

Allocco, Michael.

(1)

Amiri, Mehdi, author.

(1)

Ang, Alfredo Hua-Sing, 1930- author.

(1)

Ayyub, Bilal M.

(1)

Bahret, Adam P., 1973- author.

(1)

Beck, André T., author.

(1)

Bergman, Bo, 1943-

(1)

Bernstein, Joseph.

(1)

Blischke, W. R., 1934-

(1)

(1)

Bolia, Nomesh, author.

(1)

(1)

Bradley, Edgar.

(1)

Chaturvedi, Sanjay K., author.

(1)

Chaturvedi, Sanjay K., editor.

(1)

(1)

Curtis, Peter M.

(1)

Cătuneanu, Vasile M.

(1)

De Leon, David (De Leon Escobido), author.

(1)

(1)

Dhillon, B. S., author.

(1)

Dodson, Bryan, 1962- author.

(1)

Dummer, G. W. A. (Geoffrey William Arnold)

(1)

(1)

El Hami, Abdelkhalak, author.

(1)

El Hami, Abdelkhalak.

(1)

El-Reedy, Mohamed Abdallah., author.

(1)

Elishakoff, Isaac, author.

(1)

Elsayed, Elsayed A., author.

(1)

Ettouney, Mohammed, author.

(1)

Ettouney, Mohammed., author.

(1)

(1)

Fan, Wenliang, author.

(1)

Feinberg, Alec.

(1)

(1)

Frohne, Philip T.

(1)

Gacula, Maximo C.

(1)

Garg, Harish, editor.

(1)

Gargama, Heeralal, editor.

(1)

Garvey, Paul R., 1956-

(1)

Glismann, Peter J., author.

(1)

Gnedenko, B. V. (Boris Vladimirovich), 1912-1995.

(1)

Groth, Katrina, author.

(1)

Grous, Ammar, author.

(1)

Grzeskowiak, Henri.

(1)

Gullo, Louis J.

(1)

Gunawan, Indra.

(1)

Hammett, Patrick C., author.

(1)

Harrison, Robert A.

(1)

Hattangadi, A. A.

(1)

Hinchcliffe, Glenn R.

(1)

Hollnagel, Erik, 1941-

(1)

Hollnagel, Erik, 1941- editor.

(1)

Hwang, Jaejin, author.

(1)

IEEE Xplore (Online Service), distributor.

(1)

Jackson, Christopher, 1979- author.

(1)

Jackson, Scott, author.

(1)

Jackson, Scott.

(1)

Jin, Tongdan, author.

(1)

John Wiley & Sons.

(1)

Jones, James V.

(1)

(1)

Kalal, Ted T., author.

(1)

Kaminskiy, Mark, 1946-

(1)

Kannan, SriRaman.

(1)

Kapur, Kailash C., 1941- author.

(1)

Kimber, Douglas A.

(1)

Kimura, Mitsutaka, editor.

(1)

Klerx, Rene, author.

(1)

Kleyner, Andre.

(1)

Klir, George J., 1932-

(1)

Klyatis, Lev M.

(1)

Kosikowski, D. M.

(1)

Kołowrocki, Krzysztof, author.

(1)

Krivtsov, Vasiliy, 1963-

(1)

Kuo, Way, 1951-

(1)

Lefevre, Bruce G.

(1)

Lemaire, Maurice.

(1)

Leroy, Alain, author.

(1)

Levin, Mark, 1959-

(1)

Levin, Mark, 1959- author.

(1)

Levitin, Gregory, author.

(1)

Lewis, Ted G., author

(1)

Li, Yan-Fu, author.

(1)

Limnios, N. (Nikolaos)

(1)

Little, R. E. (Robert Eugene), 1933-

(1)

Liu, Yiliu, author.

(1)

LuValle, Michael J., author.

(1)

Malik, S. C., editor.

(1)

Melchers, R. E. (Robert E.), 1945- author.

(1)

Melching, Charles S.

(1)

Mihalache, Adrian.

(1)

Misra, Krishna B., 1943-

(1)

Modarres, M. (Mohammad)

(1)

Modarres, Mohammad.

(1)

Moskowitz, Howard R.

(1)

Mourelatos, Zissimos P.

(1)

Murthy, D. N. P.

(1)

Muñoz, Alejandra M., 1957-

(1)

Natvig, Bent, 1946-

(1)

Nelson, Wayne, 1936-

(1)

Nemeth, Christopher P., editor.

(1)

Nikolaidis, Efstratios, author.

(1)

O'Connor, Patrick P.

(1)

(1)

Panchal, Dilbagh, editor.

(1)

Pandey, Vijitashwa.

(1)

Pecht, Michael, author.

(1)

Pinto, Cesar Ariel., author.

(1)

(1)

Qamber, Isa S., author.

(1)

Radi, Bouchaïb, author.

(1)

Rai, Bharatendra K., author.

(1)

Rai, Rajiv N., editor.

(1)

Rai, Rajiv Nandan, author.

(1)

(1)

Ram, Mangey, editor.

(1)

Ranganathan, Subramanyam.

(1)

Rausand, Marvin.

(1)

Raĭzer, V. D. (Vladimir Davidovich), author.

(1)

Roberts, author.

(1)

Rodin, Jonathan, 1957- author.

(1)

SOLE--The International Society of Logistics.

(1)

Saket, R. K., editor.

(1)

Saleh, Joseph H..

(1)

Sanjeevikumar, Padmanaban, 1978-

(1)

Singer, author.

(1)

(1)

Smith, Anthony M.

(1)

Smith, David J.

(1)

Smith, David J. (David John), 1943 June 22-

(1)

Smith, David John, 1943-

(1)

Spurgin, Anthony J., author.

(1)

(1)

Tacchini, Marco, author.

(1)

Tawancy, Hani M., author.

(1)

Taylor, Zachary, 1959-

(1)

Tobias, Paul A.

(1)

(1)

Todinov, M. T., author.

(1)

Tooley, Michael H.

(1)

Trindade, David C.

(1)

Tung, Yeou-Koung.

(1)

Ul-Hamid, Anwar.

(1)

Walker, N. Edward.

(1)

Wang, Chaonan, 1986- author.

(1)

Wang, John X., 1962-

(1)

Wang, John X., 1962- author.

(1)

Wasserman, Gary S., 1951, author.

(1)

Wessels, William R., author.

(1)

Wiley, publisher.

(1)

(1)

Wohlgemuth, J. (John), 1946- author.

(1)

Woo, Seong-woo, author.

(1)

Woo, Seongwoo, 1966- author.

(1)

Xing, Liudong, author.

(1)

Yang, Guangbin, 1964-

(1)

Yen, Ben Chie, 1935-

(1)

(1)

(1)

Zio, Enrico, author.

(1)

Şencan, Hüner.

(1)

Language

(125)

Publication Date

-

(11)

(11)

(10)

(7)

(7)

(6)

(6)

(6)

(6)

(5)

(5)

(5)

(5)

(5)

(4)

(4)

(3)

(3)

(3)

(2)

(2)

(2)

(2)

(2)

(2)

(1)

(1)

(1)

(1)

(1)

(1)

(1)

Subject

Electronic books.

(27)

(27)

Engineering design.

(13)

TECHNOLOGY & ENGINEERING.

(10)

Risk assessment.

(9)

Industrial safety.

(8)

Maintainability (Engineering)

(8)

Systems engineering.

(8)

TECHNOLOGY / Manufacturing

(8)

Quality control.

(7)

TECHNOLOGY & ENGINEERING -- Engineering (General)

(7)

TECHNOLOGY & ENGINEERING -- Reference.

(7)

Risk management.

(5)

TECHNOLOGY / Quality Control

(5)

Quality Control.

(4)

System failures (Engineering)

(4)

Technology -- Risk assessment.

(4)

Accelerated life testing.

(3)

Engineering mathematics.

(3)

Güvenilirlik (Mühendislik)

(3)

Human engineering.

(3)

Industrial Engineering.

(3)

Industrial design.

(3)

Ingénierie des systèmes.

(3)

Safety factor in engineering.

(3)

Structural failures -- Prevention.

(3)

System analysis

(3)

(3)

Analyse de systèmes.

(2)

Electric power systems.

(2)

(2)

Engineering -- Management.

(2)

(2)

(2)

Fault tolerance (Engineering)

(2)

Human-machine systems.

(2)

MATHEMATICS / Probability & Statistics / Bayesian Analysis

(2)

(2)

Operations research.

(2)

(2)

Plant maintenance.

(2)

Product life cycle.

(2)

Quality Control & Reliability

(2)

Reproducibility of Results.

(2)

(2)

Six sigma (Quality control standard)

(2)

Structural design.

(2)

Structural health monitoring.

(2)

Structural stability.

(2)

System analysis.

(2)

Systems Analysis

(2)

Systems engineering

(2)

Sécurité du travail.

(2)

TECHNOLOGY & ENGINEERING / Quality Control

(2)

TECHNOLOGY / Electricity

(2)

TECHNOLOGY / Engineering / Industrial

(2)

TECHNOLOGY / Engineering / Mechanical

(2)

TECHNOLOGY / Industrial Design / Product

(2)

occupational safety.

(2)

systems analysis.

(2)

Airplanes -- Maintenance and repair -- Quality control.

(1)

Analyse des défaillances (Ingénierie)

(1)

Automobiles -- Reliability.

(1)

BUSINESS & ECONOMICS / Quality Control

(1)

Biomedical engineering.

(1)

Business logistics -- Management.

(1)

Business logistics.

(1)

Cellules photovoltaïques.

(1)

(1)

Commercial products -- Sensory evaluation.

(1)

Computational intelligence

(1)

Computational intelligence.

(1)

Computer programs -- Evaluation.

(1)

Computer software -- Evaluation

(1)

Computer software -- Evaluation.

(1)

Conception technique.

(1)

Constructions -- Stabilité.

(1)

Corporate culture

(1)

Corporate culture.

(1)

Culture organisationnelle.

(1)

Decision making.

(1)

Développement durable.

(1)

Electric power-plants -- Maintenance and repair -- Quality control.

(1)

Electronic apparatus and appliances -- Design and construction -- Quality control.

(1)

Electronic books

(1)

Electronic circuit design.

(1)

Embedded computer systems -- Design and construction.

(1)

Endüstriyel güvenlik.

(1)

(1)

Engineering Management

(1)

Engineering inspection.

(1)

Errors -- Prevention.

(1)

Fabrication -- Informatique.

(1)

Failure analysis (Engineering)

(1)

Failure time data analysis.

(1)

(1)

Finite element method.

(1)

Fracture Mechanics.

(1)

Fracture mechanics.

(1)

Gestion du risque.

(1)

GÜVENİLİRLİK (MÜHENDİSLİK)

(1)

Human-machine systems -- Reliability.

(1)

Hydraulic structures.

(1)

Industrial design -- Statistical methods.

(1)

Industrial priorities.

(1)

Industrial safety

(1)

Infrastructure (Economics)

(1)

Intelligence informatique.

(1)

Interconnects (Integrated circuit technology)

(1)

Large scale systems -- Evaluation.

(1)

(1)

(1)

Logiciels -- Évaluation.

(1)

MATHEMATICS / Probability & Statistics / General

(1)

Machine design -- Statistical methods.

(1)

Machine design.

(1)

(1)

Machinery -- Safety regulations.

(1)

Machinery -- Standards

(1)

Machinery -- Standards.

(1)

Machines -- Normes.

(1)

Manufacturing processes -- Data processing

(1)

Manufacturing processes -- Data processing.

(1)

Manufacturing processes.

(1)

(1)

(1)

Mechanical wear

(1)

Mechanical wear.

(1)

(1)

Medical care -- Quality control.

(1)

Medical errors.

(1)

Medical instruments and apparatus -- Design and construction -- Quality control.

(1)

Medical instruments and apparatus -- Safety measures.

(1)

Medical instruments and apparatus -- Standards.

(1)

Medical instruments and apparatus industry -- Quality control.

(1)

(1)

(1)

Multidisciplinary design optimization

(1)

MÜHENDİSLİK MATEMATİĞİ.

(1)

Méthode des éléments finis.

(1)

Mühendislik tasarımı.

(1)

Occupational Health

(1)

Operations Research

(1)

Photovoltaic cells

(1)

Photovoltaic cells.

(1)

(1)

(1)

(1)

Python (Computer program language)

(1)

Python (Langage de programmation)

(1)

Quality Management

(1)

Quality assurance.

(1)

Quality control

(1)

Quality control -- Statistical methods.

(1)

Quality of products.

(1)

Qualité -- Contrôle.

(1)

Reinforced concrete.

(1)

Reliability (Engineering) -- Economic aspects.

(1)

Reliability (Engineering) -- Mathematical models.

(1)

Risk Assessment.

(1)

Risk management

(1)

Robust statistics.

(1)

Réseaux électriques (Énergie)

(1)

SCIENCE -- Energy.

(1)

SCIENCE / General

(1)

Safety factor in engineering

(1)

Safety regulations

(1)

Service life (Engineering)

(1)

Social sciences -- Methodology.

(1)

Social sciences -- Statistical methods.

(1)

(1)

Sosyal Bilimler -- Yöntembilim.

(1)

Sosyal Bilimler -- İstatistiksel Yöntemler.

(1)

Stochastic systems.

(1)

Structural engineering -- Mathematics.

(1)

Structural failures.

(1)

Structural stability

(1)

Sustainable development

(1)

Sustainable development.

(1)

Sustainable engineering

(1)

(1)

System failures (Engineering) -- Prevention.

(1)

Systems availability.

(1)

Systems engineering -- Case studies.

(1)

Sécurité des systèmes.

(1)

TECHNOLOGY & ENGINEERING -- Civil -- General.

(1)

TECHNOLOGY & ENGINEERING -- Electrical.

(1)

TECHNOLOGY & ENGINEERING -- Electronics -- General.

(1)

TECHNOLOGY & ENGINEERING -- Quality Control.

(1)

TECHNOLOGY / Engineering / Civil

(1)

TECHNOLOGY / Engineering / General

(1)

TECHNOLOGY / Imaging Systems

(1)

TECHNOLOGY / Industrial Design / General

(1)

TECHNOLOGY / Industrial Health & Safety

(1)

TECHNOLOGY / Industrial Technology

(1)

TECHNOLOGY / Operations Research

(1)

Teknoloji -- Risk yönetimi.

(1)

(1)

Total quality management.

(1)

Transportation -- Safety measures.

(1)

Material Type

Shelf Location

Beytepe General Collection

Electronic Library

Taylor Francis E-Book Collection

Wiley E-Book Collection

Library

Beytepe Library

{sortLabel}

	{facetName}	{results}

	{displayName}	{count}
{error}

Switch to list view

Switch to thumbnail view

Select an Action

Place Hold(s)
Add to My Lists
Email
Print

130 Results Found

Subscribe to search results

1 .. 7 8 9 10 11

0000000000DEFAULT

Print

Select a list

Make this your default list.

The following items were successfully added.

There was an error while adding the following items. Please try again.

One or more items could not be added because you are not logged in.

121.

Cover image for Reliability modeling, prediction, and optimization

Reliability modeling, prediction, and optimization

Reliability modeling, prediction, and optimization

Author

Blischke, W. R., 1934- Murthy, D. N. P. Wiley InterScience (Online service)

Preferred Shelf Number

ONLINE

Electronic Access

Wiley InterScience An electronic book accessible through the World Wide Web; click for information
Ebook Library Click here to view book
Available by subscription from Safari Books Online
Contributor biographical information http://catdir.loc.gov/catdir/bios/wiley043/99053029.html
HathiTrust Digital Library, Limited view (search only) http://catalog.hathitrust.org/api/volumes/oclc/42708105.html

Format:

Availability

Online Library~1

Available:
Copies:

122.

Cover image for Medical device reliability and associated areas

Medical device reliability and associated areas

Medical device reliability and associated areas

Author

Dhillon, B. S. (Balbir S.), 1947, author.

Preferred Shelf Number

R855.3 .D47 2000

Electronic Access

Click here to view.

Format:

Availability

Online Library~1

Available:
Copies:

123.

Cover image for Design reliability : fundamentals and applications

Design reliability : fundamentals and applications

Design reliability : fundamentals and applications

Author

Dhillon, B. S. (Balbir S.), 1947-

Preferred Shelf Number

TA174 .D4929 1999

Electronic Access

Taylor & Francis https://www.taylorfrancis.com/books/9781420050141
Taylor & Francis https://www.taylorfrancis.com/books/9780367802400
OCLC metadata license agreement http://www.oclc.org/content/dam/oclc/forms/terms/vbrl-201703.pdf

Format:

Availability

Online Library~1

Available:
Copies:

124.

Cover image for Cognitive reliability and error analysis method CREAM

Cognitive reliability and error analysis method CREAM

Cognitive reliability and error analysis method CREAM

Author

Hollnagel, Erik, 1941-

Preferred Shelf Number

ONLINE

Electronic Access

ScienceDirect http://www.sciencedirect.com/science/book/9780080428482

Format:

Availability

Online Library~1

Available:
Copies:

125.

Cover image for The design analysis handbook a practical guide to design validation

The design analysis handbook a practical guide to design validation

The design analysis handbook a practical guide to design validation

Author

Walker, N. Edward.

Preferred Shelf Number

ONLINE

Electronic Access

ScienceDirect http://www.sciencedirect.com/science/book/9780750690881

Format:

Availability

Online Library~1

Available:
Copies:

126.

Cover image for An elementary guide to reliability

An elementary guide to reliability

An elementary guide to reliability

Author

Dummer, G. W. A. (Geoffrey William Arnold) Tooley, Michael H. Winton, R. C.

Preferred Shelf Number

ONLINE

Electronic Access

ScienceDirect http://www.sciencedirect.com/science/book/9780750635530

Format:

Availability

Online Library~1

Available:
Copies:

127.

Cover image for Probability, statistics, reliability for engineers

Probability, statistics, reliability for engineers

Probability, statistics, reliability for engineers

Author

Ayyub, Bilal M. McCuen, Richard H., 1941-

Preferred Shelf Number

TA 330 A99 1997

Format:

Availability

Beytepe Library~1

Available:
Copies:

128.

Cover image for New trends in system reliability evaluation

New trends in system reliability evaluation

New trends in system reliability evaluation

Author

Misra, Krishna B., 1943-

Preferred Shelf Number

ONLINE

Electronic Access

ScienceDirect http://www.sciencedirect.com/science/book/9780444816603

Format:

Availability

Online Library~1

Available:
Copies:

129.

Cover image for Reliability fundamentals

Reliability fundamentals

Reliability fundamentals

Author

Cătuneanu, Vasile M. Mihalache, Adrian.

Preferred Shelf Number

ONLINE

Electronic Access

ScienceDirect http://www.sciencedirect.com/science/book/9780444988799

Format:

Availability

Online Library~1

Available:
Copies:

130.

Cover image for Applied life data analysis

Applied life data analysis

Applied life data analysis

Author

Nelson, Wayne, 1936- John Wiley & Sons.

Preferred Shelf Number

ONLINE

Electronic Access

John Wiley http://dx.doi.org/10.1002/0471725234

Format:

Availability

Online Library~1

Available:
Copies:

Select an Action

Place Hold(s)
Add to My Lists
Email
Print

1 .. 7 8 9 10 11

Copyright 2018 Sirsi Corporation - Enterprise Version 5.0.0.11