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229. 
Cover image for Lifetime Spectroscopy A Method of Defect Characterization in Silicon for Photovoltaic Applications
Lifetime Spectroscopy A Method of Defect Characterization in Silicon for Photovoltaic Applications
Author 
Rein, Stefan. author. SpringerLink (Online service)
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http://dx.doi.org/10.1007/3-540-27922-9
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230. 
Cover image for Finite Element Methods and Their Applications
Finite Element Methods and Their Applications
Author 
Chen, Zhangxin. author. SpringerLink (Online service)
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http://dx.doi.org/10.1007/3-540-28078-2
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231. 
Cover image for Semiconductor Nanocrystals and Silicate Nanoparticles
Semiconductor Nanocrystals and Silicate Nanoparticles
Author 
Peng, X. editor. Mingos, D. M. P. editor. SpringerLink (Online service)
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http://dx.doi.org/10.1007/b11020
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