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Bender, Manfred. Kromidas, Stavros. Wiley InterScience (Online service)
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Rust, Roland T. Oliver, Richard L., 1945-
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Symposium D on Diagnostic Techniques for Semiconductor Materials Analysis and Fabrication Process Control (1992 : Strasbourg, France) Crean, G. M. Stuck, R. Woollam, John A. European Materials Research Society.
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Gacula, Maximo C. Wiley InterScience (Online service)
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Ramamoorthy, S. Baddaloo, Earle Gerard Yantdeo, 1946-
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John, Peter William Meredith.
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HathiTrust Digital Library, Limited view (search only) http://catalog.hathitrust.org/api/volumes/oclc/21329921.html
John Wiley http://dx.doi.org/10.1002/9780470316825
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Dalgleish, D. I.
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Billingsley, J., ed.
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Stewart, George F., 1908-1982.
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