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Author

SpringerLink (Online service)

(31)

Yadav, Sanjay. editor.

(3)

Astakhov, Viktor P., author.

(2)

Collège français de métrologie.

(2)

Gåsvik, Kjell J.

(2)

John Wiley & Sons.

(2)

(2)

Mills, David L., author.

(2)

Osten, Wolfgang.

(2)

Osten, Wolfgang. editor.

(2)

Whitehouse, D. J. (David J.), author.

(2)

Whitehouse, D. J. (David J.). Handbook of surface metrology.

(2)

Wiley InterScience (Online service)

(2)

Abran, Alain, 1949-

(1)

Ahmed Osman, Osman. editor.

(1)

Arya, Yogendra. editor.

(1)

(1)

Aswal, Dinesh K. editor.

(1)

Azrar, Lahcen. editor.

(1)

Bach, Friedrich-Wilhelm. editor.

(1)

Bahubalendruni, M.V.A. Raju. editor.

(1)

Bandyopadhyay, Sanghamitra. editor.

(1)

Baqersad, Javad, editor.

(1)

Baqersad, Javad. editor.

(1)

Beidouri, Zitouni. editor.

(1)

Berglund, Birgitta.

(1)

Biswal, Bibhuti Bhusan. editor.

(1)

Boutier, A. (Alain)

(1)

Bowen, D. Keith (David Keith), 1940- author.

(1)

Brown, Christopher A. editor.

(1)

Brown, Robert. author.

(1)

Callegaro, Luca., author.

(1)

Cardoso, Jaime S. editor.

(1)

Chaari, Fakher. editor.

(1)

Chaudhary, K.P. editor.

(1)

Ciaccio, Marcello. editor.

(1)

Czichos, Horst. editor.

(1)

Dahiya, Aman. editor.

(1)

Davim, J. Paulo, editor.

(1)

Deepak, B.B.V.L. editor.

(1)

Deng, Lvxiang. editor.

(1)

Denkena, Berend. editor.

(1)

Di Maio, Dario, editor.

(1)

Di Maio, Dario. editor.

(1)

Diebold, A. C. (Alain C.)

(1)

Diering, Magdalena. editor.

(1)

Dinkelacker, Friedrich. editor.

(1)

Doering, Robert, 1946-

(1)

Donnerhacke, Karl-Heinz.

(1)

Emery, A. F. (Ashley Francis), 1934- author.

(1)

Engen, Glenn F.

(1)

(1)

Falldorf, Claas. author.

(1)

Faller, R.V., editor.

(1)

Forbes, Alistair B. editor.

(1)

Franceschini, Fiorenzo. author.

(1)

Fujita, Daisuke, editor.

(1)

Gahlot, Ajay. editor.

(1)

Galetto, Maurizio. author.

(1)

Galyer, J. F. W.

(1)

Gao, Wei. editor.

(1)

Garg, Naveen. editor.

(1)

Gilmore, Adam M., editor.

(1)

Gläser, Michael, 1942-

(1)

Guo, Chunlei, editor.

(1)

Gupta, S. V. author.

(1)

Gupta, S. V., author.

(1)

Haddar, Mohamed. editor.

(1)

Haitjema, Han, author.

(1)

Harding, Kevin G.

(1)

Harvie, Julie. editor.

(1)

Hebra, Alexius J. author.

(1)

Hocken, Robert J.

(1)

Horn, Alexander, PD Dr.

(1)

International Metrology Conference (13th : 2007 : French College of Metrology)

(1)

International Modal Analysis Conference (41st : 2023)

(1)

Jalid, Abdelilah. editor.

(1)

Jones, Frank E., author.

(1)

Jüptner, Werner. author.

(1)

Kaiser, Debra L., editor.

(1)

Kaschke, Michael F.

(1)

Kaufmann, Guillermo H.

(1)

Kes, P. H. (Peter H.)

(1)

Knoll, Gunter. editor.

(1)

Kochsiek, Manfred.

(1)

Kramer, Thomas R. author.

(1)

Kryszkiewicz, Marzena. editor.

(1)

Kujawinska, Malgorzata. editor.

(1)

Kumar, Harish. editor.

(1)

Kumar, Rahul. editor.

(1)

Lamouri, Samir. editor.

(1)

(1)

Leach, Richard, author.

(1)

Link, Albert N., author.

(1)

Lira, Ignacio, 1951- author.

(1)

Liu, Zheng. editor.

(1)

Lund, Anders. editor.

(1)

Maier, Hans Jürgen. editor.

(1)

Maisano, Domenico. author.

(1)

Malacara, Daniel, 1937-

(1)

Mansfield, Elisabeth, editor.

(1)

Mark, William D.

(1)

Mastrogiacomo, Luca. author.

(1)

Meinrath, G. author.

(1)

Moneim Elhadi Sulieman, Abdel. editor.

(1)

Muralikrishnan, Bala. author.

(1)

Niel, Kurt. editor.

(1)

Nishi, Yoshio, 1940-

(1)

Padilla, J. Moisés (José Moisés), author.

(1)

Pal, Sankar K. editor.

(1)

Papadakis, Emmanuel P., author.

(1)

Pardo, Xosé M. editor.

(1)

Paredes, Roberto. editor.

(1)

Parhi, D.R.K. editor.

(1)

Pavese, Franco. editor.

(1)

Pereira, Paulo H.

(1)

Prakash, Chander, editor.

(1)

Pralio, Barbara. author.

(1)

Proulx, Tom. editor.

(1)

Quinten, Michael.

(1)

Quiroga, J. Antonio (Juan Antonio), author.

(1)

Rachakonda, Prem. editor.

(1)

Raja, Jay. author.

(1)

Ramuhalli, Pradeep. editor.

(1)

Raza, Hassan. editor.

(1)

Reingand, Nadya.

(1)

Reithmeier, Eduard. editor.

(1)

Rienäcker, Adrian. editor.

(1)

Rill, Michael Stefan.

(1)

(1)

Rogalla, H. (Horst)

(1)

Rybinski, Henryk. editor.

(1)

Saito, Tetsuya. editor.

(1)

Schaeffer, Ronald D., author.

(1)

Schnars, Ulf. author.

(1)

Schneider, Petra. author.

(1)

Schoonover, Randall M.

(1)

Sennaroglu, Alphan.

(1)

Servín, Manuel, author.

(1)

Shiotani, Masaru. editor.

(1)

Shotbolt, C. R., ort. yaz.

(1)

Siadat, Ali. editor.

(1)

Silvani, Xavier. author.

(1)

Singh, Subhash Chandra (Writer on technology), editor.

(1)

Singh, Sunpreet, 1989- editor.

(1)

(1)

Smith, Bruce W., 1959-

(1)

Smith, Leslie. editor.

(1)

(1)

Stefanski, Matthew. editor.

(1)

Stock, Stuart R., author.

(1)

Suzuki, Kazuaki.

(1)

Taha Janan, Mourad. editor.

(1)

Takatsuji, Toshiyuki. editor.

(1)

Tanner, B. K. (Brian Keith)

(1)

Taylor and Francis.

(1)

Thompson, Brian J.

(1)

Tuchin, V. V. (Valerii Viktorovich)

(1)

Ukida, Hiroyuki. editor.

(1)

Voorde, M. H. van de (Marcel H.), editor.

(1)

Vosk, Ted, author.

(1)

Walber, Chad. editor.

(1)

Watson, John. author.

(1)

Wieczorowski, Michał. editor.

(1)

Wong, Terence K. S.

(1)

Xu, Xun. author.

(1)

(1)

Yoshizawa, Toru, 1939-

(1)

Zainuddin, Hidayat. editor.

(1)

Zarbane, Khalid. editor.

(1)

Zhao, Yaoyao (Fiona). author.

(1)

Language

(92)

(1)

Publication Date

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(10)

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(8)

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(6)

(5)

(5)

(5)

(5)

(3)

(2)

(2)

(2)

(2)

(2)

(2)

(2)

(1)

(1)

(1)

(1)

(1)

(1)

(1)

(1)

(1)

Subject

(15)

Electronic books.

(8)

(8)

Nanotechnology.

(7)

(6)

Optical measurements.

(6)

(5)

(5)

(4)

Surfaces (Physics).

(4)

(3)

Computer aided design.

(3)

Computer vision.

(3)

Industrial engineering.

(3)

Machinery and Machine Elements.

(3)

Metrology and Fundamental Constants.

(3)

Production engineering.

(3)

Aerospace Technology and Astronautics.

(2)

Aerospace engineering.

(2)

(2)

(2)

(2)

Drilling and boring machinery.

(2)

(2)

Engineering design.

(2)

Hydraulic engineering.

(2)

Image processing.

(2)

Industrial and Production Engineering.

(2)

(2)

(2)

Mass (Physics) -- Measurement.

(2)

(2)

Measurement Science and Instrumentation.

(2)

(2)

Mechanics, Applied.

(2)

Microtechnology.

(2)

Optical measurements -- Handbooks, manuals, etc.

(2)

Physical measurements.

(2)

Process Engineering.

(2)

Quality control.

(2)

Signal processing.

(2)

Speckle metrology.

(2)

Surfaces (Technology) -- Measurement.

(2)

(2)

TECHNOLOGY / Material Science

(2)

Telecommunication.

(2)

Analytical biochemistry.

(1)

Applied Dynamical Systems.

(1)

Ağırlıklar ve ölçüler -- Türkiye

(1)

BUSINESS & ECONOMICS / Econometrics

(1)

BUSINESS & ECONOMICS / Economics / Theory

(1)

BUSINESS & ECONOMICS / Government & Business

(1)

(1)

Building materials.

(1)

COMPUTERS -- Software Development & Engineering -- Quality Assurance & Testing.

(1)

Cellular Stress.

(1)

Characterization and Analytical Technique.

(1)

Chemical engineering.

(1)

Chemistry, Physical and theoretical.

(1)

(1)

Communications Engineering, Networks.

(1)

Compound semiconductors -- Design and construction -- Materials.

(1)

Computer networks -- Management.

(1)

Computer networks.

(1)

Computer science -- Mathematics.

(1)

Computer vision -- Congresses.

(1)

Control engineering systems.

(1)

Control engineering.

(1)

Control, Robotics, Automation.

(1)

Coordinate measuring machines.

(1)

Corrosion and anti-corrosives.

(1)

(1)

Dental Medicine

(1)

(1)

Diffraction patterns.

(1)

Dimensional analysis -- Handbooks, manuals, etc.

(1)

Dimensional analysis.

(1)

Distribution (Probability theory).

(1)

(1)

Electric network analyzers.

(1)

Electric power production.

(1)

Electrical Power Engineering.

(1)

(1)

Electronics and Microelectronics, Instrumentation.

(1)

Engineering Fluid Dynamics.

(1)

Engineering Thermodynamics, Heat and Mass Transfer.

(1)

Engineering mathematics.

(1)

Environmental toxicology.

(1)

(1)

Fluid mechanics -- Measurement.

(1)

(1)

Food -- Analysis.

(1)

Food -- Microbiology.

(1)

Food -- Safety measures.

(1)

Food Chemistry.

(1)

Food Microbiology.

(1)

(1)

(1)

(1)

Forensic sciences.

(1)

Gearing -- Vibration -- Mathematical models.

(1)

Gearing -- Vibration -- Measurement.

(1)

(1)

Holographic testing.

(1)

Human information processing -- Mathematical models.

(1)

Hydraulic measurements.

(1)

Imaging systems in medicine -- Handbooks, manuals, etc.

(1)

Imaging systems.

(1)

Industrial safety.

(1)

Integrated circuits -- Masks.

(1)

Integrated circuits -- Measurement.

(1)

Interferometry.

(1)

Lasers -- Industrial applications.

(1)

(1)

Machines, Tools, Processes.

(1)

Manufacturing processes.

(1)

Masks (Electronics) -- Handbooks, manuals, etc.

(1)

Materials -- Analysis.

(1)

Materials -- Testing.

(1)

Materials Engineering.

(1)

Mathematical statistics.

(1)

(1)

(1)

Measurement -- Congresses.

(1)

Measurement -- Handbooks, manuals, etc.

(1)

Measuring instruments.

(1)

Mechanical engineering.

(1)

Mechanics, applied.

(1)

Metal oxide semiconductors, Complementary -- Design and construction.

(1)

(1)

(1)

Metrology -- Economic aspects.

(1)

Metrology -- Handbooks, manuals, etc.

(1)

(1)

Microelectromechanical systems -- Measurement.

(1)

Microelectronics -- Measurement.

(1)

Microelectronics.

(1)

Microfabrication.

(1)

Microlithography -- Industrial applications.

(1)

Micromachining.

(1)

Microwave circuits.

(1)

Microwave measurements.

(1)

Microwaves, RF Engineering and Optical Communications.

(1)

Motor vehicles -- Transmission devices.

(1)

Motor vehicles -- Vibration -- Measurement.

(1)

Multibody Systems and Mechanical Vibrations.

(1)

Multibody systems.

(1)

(1)

Nanophotonics -- Handbooks, manuals, etc.

(1)

(1)

Nanotechnologie.

(1)

Network Time Protocol (Computer network protocol)

(1)

(1)

Nondestructive testing -- Cost effectiveness.

(1)

Nonlinear theories.

(1)

Nuclear chemistry.

(1)

(1)

(1)

Oceanographic instruments.

(1)

Oceanography -- Measurement.

(1)

Ophthalmology -- Equipment and supplies.

(1)

Optical Metrology.

(1)

Optical data processing.

(1)

Optical detectors -- Industrial applications.

(1)

Optical instruments -- Handbooks, manuals, etc.

(1)

Optics -- Handbooks, manuals, etc.

(1)

Optometry -- Equipment and supplies.

(1)

(1)

Parameter estimation.

(1)

Perception -- Mathematical models.

(1)

Photobiology -- Handbooks, manuals, etc.

(1)

Photonics -- Handbooks, manuals, etc.

(1)

(1)

Phototherapy -- Handbooks, manuals, etc.

(1)

Physical measurements

(1)

Quality control -- Optical methods.

(1)

(1)

Quantum Measurement and Metrology.

(1)

Quantum physics.

(1)

Radiation Dosimetry and Protection.

(1)

Radiation dosimetry.

(1)

(1)

(1)

SCIENCE / Mechanics / General

(1)

SCIENCE / Optics.

(1)

SCIENCE / Physics

(1)

Semiconductor industry -- Handbooks, manuals, etc.

(1)

Semiconductor wafers -- Inspection.

(1)

Semiconductors -- Design and construction -- Handbooks, manuals, etc.

(1)

Semiconductors -- Design and construction -- Materials.

(1)

Semiconductors -- Design and construction -- Quality control.

(1)

Semiconductors -- Inspection.

(1)

Semiconductors -- Measurement.

(1)

Senses and sensation -- Mathematical models.

(1)

Sensors and biosensors.

(1)

Signal, Speech and Image Processing.

(1)

Silicon-on-insulator technology.

(1)

Software measurement -- Design -- Case studies.

(1)

Software measurement -- Design.

(1)

Solid Mechanics.

(1)

Material Type

Shelf Location

Beytepe General Collection

Electronic Library

Karger E-Book Collection

Taylor Francis E-Book Collection

Library

Beytepe Library

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1.

Cover image for Optical inspection of microsystems

Optical inspection of microsystems

Optical inspection of microsystems

Author

Osten, Wolfgang.

Preferred Shelf Number

TS156.2 .O652 2007

Electronic Access

Click here to view.

Format:

Availability

Online Library~1

Available:
Copies:

2.

Cover image for Solid-state lasers and applications

Solid-state lasers and applications

Solid-state lasers and applications

Author

Sennaroglu, Alphan.

Preferred Shelf Number

TA1705 .S6748 2007

Electronic Access

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3.

Cover image for Computer network time synchronization : the network time protocol

Computer network time synchronization : the network time protocol

Computer network time synchronization : the network time protocol

Author

Mills, David L., author.

Preferred Shelf Number

TK5105.5 .M564 2006

Electronic Access

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4.

Cover image for Handbook of photomask manufacturing technology

Handbook of photomask manufacturing technology

Handbook of photomask manufacturing technology

Author

Rizvi, Syed.

Preferred Shelf Number

TK7872 .M3 H36 2005

Electronic Access

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5.

Cover image for Handbook of Laser Technology and Applications (Three- Volume Set).

Handbook of Laser Technology and Applications (Three- Volume Set).

Handbook of Laser Technology and Applications (Three- Volume Set).

Author

Taylor and Francis.

Preferred Shelf Number

TA1675 .H363 2003

Electronic Access

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6.

Cover image for Practical density measurement and hydrometry

Practical density measurement and hydrometry

Practical density measurement and hydrometry

Author

Gupta, S. V., author.

Preferred Shelf Number

QD169 .W3

Electronic Access

Taylor & Francis https://www.taylorfrancis.com/books/9780367801496
OCLC metadata license agreement http://www.oclc.org/content/dam/oclc/forms/terms/vbrl-201703.pdf

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7.

Cover image for Evaluating the measurement uncertainty : fundamentals and practical guidance

Evaluating the measurement uncertainty : fundamentals and practical guidance

Evaluating the measurement uncertainty : fundamentals and practical guidance

Author

Lira, Ignacio, 1951- author.

Preferred Shelf Number

T50

Electronic Access

Taylor & Francis https://www.taylorfrancis.com/books/9780367801564
OCLC metadata license agreement http://www.oclc.org/content/dam/oclc/forms/terms/vbrl-201703.pdf

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8.

Cover image for Handbook of mass measurement

Handbook of mass measurement

Handbook of mass measurement

Author

Jones, Frank E., author. Schoonover, Randall M.

Preferred Shelf Number

QC106 .J66 2002

Electronic Access

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9.

Cover image for Handbook of optical engineering

Handbook of optical engineering

Handbook of optical engineering

Author

Malacara, Daniel, 1937- Thompson, Brian J.

Preferred Shelf Number

TA1520 .H368 2001

Electronic Access

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10.

Cover image for Assessment of Oral Health : Diagnostic Techniques and Validation Criteria

Assessment of Oral Health : Diagnostic Techniques and Validation Criteria

Assessment of Oral Health : Diagnostic Techniques and Validation Criteria

Author

Faller, R.V., editor.

Preferred Shelf Number

XX(548684.1)

Electronic Access

https://karger.com/book/doi/10.1159/isbn.978-3-318-00549-3

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