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157. 
Cover image for Debug Automation from Pre-Silicon to Post-Silicon
Debug Automation from Pre-Silicon to Post-Silicon
Author 
Dehbashi, Mehdi. author. Fey, Görschwin. author. SpringerLink (Online service)
Preferred Shelf Number 
ONLINE
Electronic Access 
https://doi.org/10.1007/978-3-319-09309-3
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158. 
Cover image for Dry Etching Technology for Semiconductors
Dry Etching Technology for Semiconductors
Author 
Nojiri, Kazuo. author. SpringerLink (Online service)
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ONLINE
Electronic Access 
https://doi.org/10.1007/978-3-319-10295-5
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159. 
Cover image for Fractional Linear Systems and Electrical Circuits
Fractional Linear Systems and Electrical Circuits
Author 
Kaczorek, Tadeusz. author. Rogowski, Krzysztof. author. SpringerLink (Online service)
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https://doi.org/10.1007/978-3-319-11361-6
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160. 
Cover image for Wafer-Level Chip-Scale Packaging Analog and Power Semiconductor Applications
Wafer-Level Chip-Scale Packaging Analog and Power Semiconductor Applications
Author 
Qu, Shichun. author. Liu, Yong. author. SpringerLink (Online service)
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https://doi.org/10.1007/978-1-4939-1556-9
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161. 
Cover image for Visual Signal Quality Assessment Quality of Experience (QoE)
Visual Signal Quality Assessment Quality of Experience (QoE)
Author 
Deng, Chenwei. editor. Ma, Lin. editor. Lin, Weisi. editor. Ngan, King Ngi. editor. SpringerLink (Online service)
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https://doi.org/10.1007/978-3-319-10368-6
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162. 
Cover image for Thermal Sensors Principles and Applications for Semiconductor Industries
Thermal Sensors Principles and Applications for Semiconductor Industries
Author 
Jha, Chandra Mohan. editor. SpringerLink (Online service)
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https://doi.org/10.1007/978-1-4939-2581-0
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163. 
Cover image for Circuit Design on Plastic Foils
Circuit Design on Plastic Foils
Author 
Raiteri, Daniele. author. Cantatore, Eugenio. author. van Roermund, Arthur. author. SpringerLink (Online service)
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https://doi.org/10.1007/978-3-319-11427-9
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164. 
Cover image for Trusted Computing for Embedded Systems
Trusted Computing for Embedded Systems
Author 
Candaele, Bernard. editor. Soudris, Dimitrios. editor. Anagnostopoulos, Iraklis. editor. SpringerLink (Online service)
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https://doi.org/10.1007/978-3-319-09420-5
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165. 
Cover image for On-Chip Electro-Static Discharge (ESD) Protection for Radio-Frequency Integrated Circuits
On-Chip Electro-Static Discharge (ESD) Protection for Radio-Frequency Integrated Circuits
Author 
Cui, Qiang. author. Liou, Juin J. author. Hajjar, Jean-Jacques. author. Salcedo, Javier. author. Zhou, Yuanzhong. author.
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https://doi.org/10.1007/978-3-319-10819-3
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166. 
Cover image for Comparators in Nanometer CMOS Technology
Comparators in Nanometer CMOS Technology
Author 
Goll, Bernhard. author. Zimmermann, Horst. author. SpringerLink (Online service)
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https://doi.org/10.1007/978-3-662-44482-5
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167. 
Cover image for Counterfeit Integrated Circuits Detection and Avoidance
Counterfeit Integrated Circuits Detection and Avoidance
Author 
Tehranipoor, Mark (Mohammad). author. Guin, Ujjwal. author. Forte, Domenic. author. SpringerLink (Online service)
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https://doi.org/10.1007/978-3-319-11824-6
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168. 
Cover image for Spintronics-based Computing
Spintronics-based Computing
Author 
Zhao, Weisheng. editor. Prenat, Guillaume. editor. SpringerLink (Online service)
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https://doi.org/10.1007/978-3-319-15180-9
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