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1. 
Cover image for Quick Start Guide to VHDL
Quick Start Guide to VHDL
Author 
LaMeres, Brock J. author. SpringerLink (Online service)
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https://doi.org/10.1007/978-3-031-42543-1
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2. 
Cover image for Active Object Languages: Current Research Trends
Active Object Languages: Current Research Trends
Author 
de Boer, Frank. editor. Damiani, Ferruccio. editor. (orcid)0000-0001-8109-1706 Hähnle, Reiner. editor. Broch Johnsen, Einar. editor. (orcid)0000-0001-5382-3949 Kamburjan, Eduard. editor. (orcid)0000-0002-0996-2543
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https://doi.org/10.1007/978-3-031-51060-1
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3. 
Cover image for Taking AIMS at Digital Design Analysis, Improvement, Modeling, and Synthesis
Taking AIMS at Digital Design Analysis, Improvement, Modeling, and Synthesis
Author 
Jantsch, Axel. author. SpringerLink (Online service)
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https://doi.org/10.1007/978-3-031-35605-6
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4. 
Cover image for Emerging Computing: From Devices to Systems Looking Beyond Moore and Von Neumann
Emerging Computing: From Devices to Systems Looking Beyond Moore and Von Neumann
Author 
Aly, Mohamed M. Sabry. editor. Chattopadhyay, Anupam. editor. SpringerLink (Online service)
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https://doi.org/10.1007/978-981-16-7487-7
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5. 
Cover image for Fundamentals of Modern Electric Circuit Analysis and Filter Synthesis A Transfer Function Approach
Fundamentals of Modern Electric Circuit Analysis and Filter Synthesis A Transfer Function Approach
Author 
Izadian, Afshin. author. SpringerLink (Online service)
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https://doi.org/10.1007/978-3-031-21908-5
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6. 
Cover image for Software Defined Chips Volume II
Software Defined Chips Volume II
Author 
Liu, Leibo. author. Wei, Shaojun. author. Zhu, Jianfeng. author. Deng, Chenchen. author. SpringerLink (Online service)
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https://doi.org/10.1007/978-981-19-7636-0
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7. 
Cover image for Embedded Systems Design using the MSP430FR2355 LaunchPad™
Embedded Systems Design using the MSP430FR2355 LaunchPad™
Author 
LaMeres, Brock J. author. SpringerLink (Online service)
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https://doi.org/10.1007/978-3-031-20888-1
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8. 
Cover image for Machine Learning Support for Fault Diagnosis of System-on-Chip
Machine Learning Support for Fault Diagnosis of System-on-Chip
Author 
Girard, Patrick. editor. Blanton, Shawn. editor. Wang, Li-C. editor. SpringerLink (Online service)
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https://doi.org/10.1007/978-3-031-19639-3
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9. 
Cover image for From Variability Tolerance to Approximate Computing in Parallel Integrated Architectures and Accelerators
From Variability Tolerance to Approximate Computing in Parallel Integrated Architectures and Accelerators
Author 
Rahimi, Abbas. author. Benini, Luca. author. Gupta, Rajesh K. author. SpringerLink (Online service)
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https://doi.org/10.1007/978-3-319-53768-9
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10. 
Cover image for Computer-Aided Design of Microfluidic Very Large Scale Integration (mVLSI) Biochips Design Automation, Testing, and Design-for-Testability
Computer-Aided Design of Microfluidic Very Large Scale Integration (mVLSI) Biochips Design Automation, Testing, and Design-for-Testability
Author 
Hu, Kai. author. Chakrabarty, Krishnendu. author. Ho, Tsung-Yi. author. SpringerLink (Online service)
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https://doi.org/10.1007/978-3-319-56255-1
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11. 
Cover image for Applications of Evolutionary Computation 20th European Conference, EvoApplications 2017, Amsterdam, The Netherlands, April 19-21, 2017, Proceedings, Part I
Applications of Evolutionary Computation 20th European Conference, EvoApplications 2017, Amsterdam, The Netherlands, April 19-21, 2017, Proceedings, Part I
Author 
Squillero, Giovanni. editor. Sim, Kevin. editor. SpringerLink (Online service)
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https://doi.org/10.1007/978-3-319-55849-3
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12. 
Cover image for Scaling OpenMP for Exascale Performance and Portability 13th International Workshop on OpenMP, IWOMP 2017, Stony Brook, NY, USA, September 20-22, 2017, Proceedings
Scaling OpenMP for Exascale Performance and Portability 13th International Workshop on OpenMP, IWOMP 2017, Stony Brook, NY, USA, September 20-22, 2017, Proceedings
Author 
de Supinski, Bronis R. editor. Olivier, Stephen L. editor. Terboven, Christian. editor. Chapman, Barbara M. editor. Müller, Matthias S. editor.
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https://doi.org/10.1007/978-3-319-65578-9
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