Search Results for Microscopy

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13.

Applied Scanning Probe Methods VIII Scanning Probe Microscopy Techniques

Author

Bhushan, Bharat. editor. Fuchs, Harald. editor. Tomitori, Masahiko. editor. SpringerLink (Online service)

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ONLINE

Electronic Access

http://dx.doi.org/10.1007/978-3-540-74080-3

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14.

Applied Scanning Probe Methods V Scanning Probe Microscopy Techniques

Author

Bhushan, Bharat. editor. Kawata, Satoshi. editor. Fuchs, Harald. editor. SpringerLink (Online service)

Preferred Shelf Number

ONLINE

Electronic Access

http://dx.doi.org/10.1007/978-3-540-37316-2

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15.

Scanning Probe Microscopy Electrical and Electromechanical Phenomena at the Nanoscale

Author

Kalinin, Sergei. editor. Gruverman, Alexei. editor. SpringerLink (Online service)

Preferred Shelf Number

ONLINE

Electronic Access

http://dx.doi.org/10.1007/978-0-387-28668-6

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16.

Applied Scanning Probe Methods II Scanning Probe Microscopy Techniques

Author

Bhushan, Bharat. editor. Fuchs, Harald. editor. SpringerLink (Online service)

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ONLINE

Electronic Access

http://dx.doi.org/10.1007/b139097

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17.

Cover image for Atomic Force Microscopy, Scanning Nearfield Optical Microscopy and Nanoscratching Application to Rough and Natural Surfaces

Atomic Force Microscopy, Scanning Nearfield Optical Microscopy and Nanoscratching Application to Rough and Natural Surfaces

Author

Kaupp, Gerd. author. SpringerLink (Online service)

Preferred Shelf Number

ONLINE

Electronic Access

http://dx.doi.org/10.1007/978-3-540-28472-7

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18.

Scanning Probe Microscopy Atomic Scale Engineering by Forces and Currents

Author

Foster, Adam. author. Hofer, Werner. author. SpringerLink (Online service)

Preferred Shelf Number

ONLINE

Electronic Access

http://dx.doi.org/10.1007/0-387-37231-8

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19.

Mono-Cycle Photonics and Optical Scanning Tunneling Microscopy Route to Femtosecond Ångstrom Technology

Author

Yamashita, Mikio. editor. Shigekawa, Hidemi. editor. Morita, Ryuji. editor. SpringerLink (Online service)

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ONLINE

Electronic Access

http://dx.doi.org/10.1007/b138671

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20.

Microscopy of Semiconducting Materials Proceedings of the 14th Conference, April 11–14, 2005, Oxford, UK

Author

Cullis, A. G. editor. Hutchison, J. L. editor. SpringerLink (Online service)

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ONLINE

Electronic Access

http://dx.doi.org/10.1007/3-540-31915-8

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21.

Physical Principles of Electron Microscopy An Introduction to TEM, SEM, and AEM

Author

Egerton, Ray F. author. SpringerLink (Online service)

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ONLINE

Electronic Access

http://dx.doi.org/10.1007/b136495

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22.

Laser Photodissociation and Spectroscopy of Mass-separated Biomolecular Ions

Author

Polfer, Nicolas C. editor. Dugourd, Philippe. editor. SpringerLink (Online service)

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ONLINE(332850.1)

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http://dx.doi.org/10.1007/978-3-319-01252-0

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23.

Hyperpolarization Methods in NMR Spectroscopy

Author

Kuhn, Lars T. editor. SpringerLink (Online service)

Preferred Shelf Number

ONLINE(334842.1)

Electronic Access

http://dx.doi.org/10.1007/978-3-642-39728-8

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24.

Modern NMR Methodology

Author

Heise, Henrike. editor. Matthews, Stephen. editor. SpringerLink (Online service)

Preferred Shelf Number

ONLINE(334511.1)

Electronic Access

http://dx.doi.org/10.1007/978-3-642-37991-8

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