Limit Search Results
Author
Language
Publication Date
-
Subject
Material Type
Shelf Location
Library
Switch to list view
Switch to thumbnail view
20 Results Found Subscribe to search results
00000000DEFAULT
Print
13. 
Cover image for Clocking in Modern VLSI Systems
Clocking in Modern VLSI Systems
Author 
Xanthopoulos, Thucydides. editor. SpringerLink (Online service)
Preferred Shelf Number 
ONLINE
Electronic Access 
http://dx.doi.org/10.1007/978-1-4419-0261-0
Format: 
Availability 
Online Library~1
Available:
Copies:
14. 
Cover image for Carbon Nanotube Electronics
Carbon Nanotube Electronics
Author 
Kong, Jing. editor. Javey, Ali. editor. SpringerLink (Online service)
Preferred Shelf Number 
ONLINE
Electronic Access 
http://dx.doi.org/10.1007/978-0-387-69285-2
Format: 
Availability 
Online Library~1
Available:
Copies:
15. 
Cover image for Design for Manufacturability and Yield for Nano-Scale CMOS
Design for Manufacturability and Yield for Nano-Scale CMOS
Author 
Chiang, Charles C. author. Kawa, Jamil. author. SpringerLink (Online service)
Preferred Shelf Number 
ONLINE
Electronic Access 
http://dx.doi.org/10.1007/978-1-4020-5188-3
Format: 
Availability 
Online Library~1
Available:
Copies:
16. 
Cover image for SAT-Based Scalable Formal Verification Solutions
SAT-Based Scalable Formal Verification Solutions
Author 
Ganai, Malay K. author. Gupta, Aarti. author. SpringerLink (Online service)
Preferred Shelf Number 
ONLINE
Electronic Access 
http://dx.doi.org/10.1007/978-0-387-69167-1
Format: 
Availability 
Online Library~1
Available:
Copies:
17. 
Cover image for Routing Congestion in VLSI Circuits: Estimation and Optimization
Routing Congestion in VLSI Circuits: Estimation and Optimization
Author 
Saxena, Prashant. author. Shelar, Rupesh S. author. Sapatnekar, Sachin S. author. SpringerLink (Online service)
Preferred Shelf Number 
ONLINE
Electronic Access 
http://dx.doi.org/10.1007/0-387-48550-3
Format: 
Availability 
Online Library~1
Available:
Copies:
18. 
Cover image for Leakage in Nanometer CMOS Technologies
Leakage in Nanometer CMOS Technologies
Author 
Narendra, Siva G. author. Chandrakasan, Anantha. author. SpringerLink (Online service)
Preferred Shelf Number 
ONLINE
Electronic Access 
http://dx.doi.org/10.1007/0-387-28133-9
Format: 
Availability 
Online Library~1
Available:
Copies:
19. 
Cover image for Abstraction Refinement for Large Scale Model Checking
Abstraction Refinement for Large Scale Model Checking
Author 
Wang, Chao. author. Hachtel, Gary D. author. Somenzi, Fabio. author. SpringerLink (Online service)
Preferred Shelf Number 
ONLINE
Electronic Access 
http://dx.doi.org/10.1007/0-387-34600-7
Format: 
Availability 
Online Library~1
Available:
Copies:
20. 
Cover image for A Practical Introduction to PSL
A Practical Introduction to PSL
Author 
Eisner, Cindy. author. Fisman, Dana. author. SpringerLink (Online service)
Preferred Shelf Number 
ONLINE
Electronic Access 
http://dx.doi.org/10.1007/978-0-387-36123-9
Format: 
Availability 
Online Library~1
Available:
Copies:
Go to:Search Results
|
Top of Page
|
Search Facets