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13. 
Cover image for Recent Advances in Sensing Technology
Recent Advances in Sensing Technology
Author 
Mukhopadhyay, Subhas Chandra. editor. Gupta, Gourab Sen. editor. Huang, Ray Yueh-Min. editor. SpringerLink (Online service)
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http://dx.doi.org/10.1007/978-3-642-00578-7
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14. 
Cover image for Smart Sensors and Sensing Technology
Smart Sensors and Sensing Technology
Author 
Mukhopadhyay, Subhas Chandra. editor. Gupta, Gourab Sen. editor. SpringerLink (Online service)
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http://dx.doi.org/10.1007/978-3-540-79590-2
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15. 
Cover image for PRECISION TEMPERATURE SENSORS IN CMOS TECHNOLOGY
PRECISION TEMPERATURE SENSORS IN CMOS TECHNOLOGY
Author 
Pertijs, Michiel A.P. author. Huijsing, Johan H. author. SpringerLink (Online service)
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http://dx.doi.org/10.1007/1-4020-5258-8
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16. 
Cover image for Electroceramic-Based MEMS Fabrication-Technology and Applications
Electroceramic-Based MEMS Fabrication-Technology and Applications
Author 
Setter, Nava. editor. SpringerLink (Online service)
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http://dx.doi.org/10.1007/b101200
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17. 
Cover image for Nanoscale Photonics and Optoelectronics Science and Technology
Nanoscale Photonics and Optoelectronics Science and Technology
Author 
Wang, Zhiming M. editor. Neogi, Arup. editor. SpringerLink (Online service)
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http://dx.doi.org/10.1007/978-1-4419-7587-4
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18. 
Cover image for Design and Implementation of Sensory Solutions for Industrial Environment Utilizing 1-wire® Technology in Industrial Solutions
Design and Implementation of Sensory Solutions for Industrial Environment Utilizing 1-wire® Technology in Industrial Solutions
Author 
Ďuďák, Juraj. author. Gašpar, Gabriel. author. SpringerLink (Online service)
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https://doi.org/10.1007/978-3-031-30152-0
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19. 
Cover image for Predictive Technology Model for Robust Nanoelectronic Design
Predictive Technology Model for Robust Nanoelectronic Design
Author 
Cao, Yu. author. SpringerLink (Online service)
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http://dx.doi.org/10.1007/978-1-4614-0445-3
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20. 
Cover image for Nanometer Technology Designs High-Quality Delay Tests
Nanometer Technology Designs High-Quality Delay Tests
Author 
Tehranipoor, Mohammad. author. Ahmed, Nisar. author. SpringerLink (Online service)
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http://dx.doi.org/10.1007/978-0-387-75728-5
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21. 
Cover image for Wafer Level 3-D ICs Process Technology
Wafer Level 3-D ICs Process Technology
Author 
Tan, Chuan Seng. editor. Gutmann, Ronald J. editor. Reif, L. Rafael. editor. SpringerLink (Online service)
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http://dx.doi.org/10.1007/978-0-387-76534-1
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22. 
Cover image for Piezoelectricity Evolution and Future of a Technology
Piezoelectricity Evolution and Future of a Technology
Author 
Heywang, Walter. author. Lubitz, Karl. author. Wersing, Wolfram. author. SpringerLink (Online service)
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http://dx.doi.org/10.1007/978-3-540-68683-5
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23. 
Cover image for Solder Joint Technology Materials, Properties, and Reliability
Solder Joint Technology Materials, Properties, and Reliability
Author 
Tu, King-Ning. author. SpringerLink (Online service)
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http://dx.doi.org/10.1007/978-0-387-38892-2
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24. 
Cover image for High-Speed Photodiodes in Standard CMOS Technology
High-Speed Photodiodes in Standard CMOS Technology
Author 
Radovanović, Saša. author. Annema, Anne-Johan. author. Nauta, Bram. author. SpringerLink (Online service)
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http://dx.doi.org/10.1007/0-387-28592-X
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