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13. 
Cover image for Reliability management and engineering : challenges and future trends
Reliability management and engineering : challenges and future trends
Author 
Garg, Harish, editor. Ram, Mangey, editor.
Preferred Shelf Number 
TA169
Electronic Access 
Taylor & Francis https://www.taylorfrancis.com/books/9780429268922
OCLC metadata license agreement http://www.oclc.org/content/dam/oclc/forms/terms/vbrl-201703.pdf
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14. 
Cover image for Guidelines for failure modes and effects analysis for medical devices
Guidelines for failure modes and effects analysis for medical devices
Author 
PRESS, DYADEM.
Preferred Shelf Number 
R856.6
Electronic Access 
Taylor & Francis https://www.taylorfrancis.com/books/9780429205804
OCLC metadata license agreement http://www.oclc.org/content/dam/oclc/forms/terms/vbrl-201703.pdf
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15. 
Cover image for Guidelines for Laboratory Quality Auditing
Guidelines for Laboratory Quality Auditing
Author 
Singer, author.
Preferred Shelf Number 
R850 .S564 2014
Electronic Access 
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16. 
Cover image for Quality Assurance in Research and Development
Quality Assurance in Research and Development
Author 
Roberts, author.
Preferred Shelf Number 
T175.5 R634 2014
Electronic Access 
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17. 
Cover image for Risk analysis in engineering and economics
Risk analysis in engineering and economics
Author 
Ayyub, Bilal M., author.
Preferred Shelf Number 
T174.5 .A99 2014
Electronic Access 
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18. 
Cover image for Designing high availability systems : design for Six Sigma and classical reliability techniques with practical real-life examples
Designing high availability systems : design for Six Sigma and classical reliability techniques with practical real-life examples
Author 
Taylor, Zachary, 1959- Ranganathan, Subramanyam. IEEE Xplore (Online Service), distributor. Wiley, publisher.
Preferred Shelf Number 
ONLINE(365001.1)
Electronic Access 
Abstract with links to resource http://ieeexplore.ieee.org/xpl/bkabstractplus.jsp?bkn=6628863
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19. 
Cover image for Design for reliability
Design for reliability
Author 
Raheja, Dev. Gullo, Louis J.
Preferred Shelf Number 
ONLINE
Electronic Access 
IEEE Xplore http://ieeexplore.ieee.org/xpl/bkabstractplus.jsp?bkn=6266791
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20. 
Cover image for Applied reliability
Applied reliability
Author 
Tobias, Paul A. Trindade, David C.
Preferred Shelf Number 
TA169 T63 2012
Format: 
Availability 
Beytepe Library~1
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21. 
Cover image for Design for reliability information and computer-based systems
Design for reliability information and computer-based systems
Author 
Bauer, Eric.
Preferred Shelf Number 
ONLINE
Electronic Access 
IEEE Xplore http://ieeexplore.ieee.org/xpl/bkabstractplus.jsp?bkn=5732779
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22. 
Cover image for Robust design methodology for reliability exploring the effects of variation and uncertainty
Robust design methodology for reliability exploring the effects of variation and uncertainty
Author 
Bergman, Bo, 1943- Wiley InterScience (Online service)
Preferred Shelf Number 
ONLINE
Electronic Access 
Ebook Library http://public.eblib.com/EBLPublic/PublicView.do?ptiID=454321
John Wiley http://dx.doi.org/10.1002/9780470748794
Cover image http://catalogimages.wiley.com/images/db/jimages/9780470713945.jpg
http://site.ebrary.com/lib/alltitles/Doc?id=10331496
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23. 
Cover image for Human reliability, error, and human factors in engineering maintenance : with reference to aviation and power generation
Human reliability, error, and human factors in engineering maintenance : with reference to aviation and power generation
Author 
Dhillon, B. S. (Balbir S.), 1947, author.
Preferred Shelf Number 
TA167 .D468 2009
Electronic Access 
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24. 
Cover image for Reliability technology, human error, and quality in health care
Reliability technology, human error, and quality in health care
Author 
Dhillon, B. S. (Balbir S.), 1947, author.
Preferred Shelf Number 
RA399 .A1 D487 2008
Electronic Access 
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