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13. 
Cover image for Digital System Test and Testable Design Using HDL Models and Architectures
Digital System Test and Testable Design Using HDL Models and Architectures
Author 
Navabi, Zainalabedin. author. SpringerLink (Online service)
Preferred Shelf Number 
ONLINE
Electronic Access 
http://dx.doi.org/10.1007/978-1-4419-7548-5
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14. 
Cover image for Power-Aware Testing and Test Strategies for Low Power Devices
Power-Aware Testing and Test Strategies for Low Power Devices
Author 
Girard, Patrick. editor. Nicolici, Nicola. editor. Wen, Xiaoqing. editor. SpringerLink (Online service)
Preferred Shelf Number 
ONLINE
Electronic Access 
http://dx.doi.org/10.1007/978-1-4419-0928-2
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15. 
Cover image for Advanced Test Methods for SRAMs Effective Solutions for Dynamic Fault Detection in Nanoscaled Technologies
Advanced Test Methods for SRAMs Effective Solutions for Dynamic Fault Detection in Nanoscaled Technologies
Author 
Bosio, Alberto. author. Dilillo, Luigi. author. Girard, Patrick. author. Pravossoudovitch, Serge. author. Virazel, Arnaud. author.
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ONLINE
Electronic Access 
http://dx.doi.org/10.1007/978-1-4419-0938-1
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16. 
Cover image for Efficient Test Methodologies for High-Speed Serial Links
Efficient Test Methodologies for High-Speed Serial Links
Author 
Hong, Dongwoo. author. Cheng, Kwang-Ting. author. SpringerLink (Online service)
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ONLINE
Electronic Access 
http://dx.doi.org/10.1007/978-90-481-3443-4
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17. 
Cover image for RF MEMS Switches and Integrated Switching Circuits Design, Fabrication, and Test
RF MEMS Switches and Integrated Switching Circuits Design, Fabrication, and Test
Author 
Liu, Ai-Qun. author. SpringerLink (Online service)
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ONLINE
Electronic Access 
http://dx.doi.org/10.1007/978-0-387-46262-2
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18. 
Cover image for CMOS SRAM Circuit Design and Parametric Test in Nano-Scaled Technologies Process-Aware SRAM Design and Test
CMOS SRAM Circuit Design and Parametric Test in Nano-Scaled Technologies Process-Aware SRAM Design and Test
Author 
Pavlov, Andrei. author. Sachdev, Manoj. author. SpringerLink (Online service)
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ONLINE
Electronic Access 
http://dx.doi.org/10.1007/978-1-4020-8363-1
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19. 
Cover image for Design, Automation, and Test in Europe The Most Influential Papers of 10 Years Date
Design, Automation, and Test in Europe The Most Influential Papers of 10 Years Date
Author 
Lauwereins, Rudy. editor. Madsen, Jan. editor. SpringerLink (Online service)
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http://dx.doi.org/10.1007/978-1-4020-6488-3
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20. 
Cover image for Design of Systems on a Chip: Design and Test
Design of Systems on a Chip: Design and Test
Author 
Reis, Ricardo. editor. Lubaszewski, Marcelo. editor. Jess, Jochen A.G. editor. SpringerLink (Online service)
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ONLINE
Electronic Access 
http://dx.doi.org/10.1007/0-387-32500-X
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21. 
Cover image for The Core Test Wrapper Handbook Rationale and Application of IEEE Std. 1500™
The Core Test Wrapper Handbook Rationale and Application of IEEE Std. 1500™
Author 
Silva, Francisco. author. McLaurin, Teresa. author. Waayers, Tom. author. SpringerLink (Online service)
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ONLINE
Electronic Access 
http://dx.doi.org/10.1007/0-387-34609-0
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22. 
Cover image for System-level Test and Validation of Hardware/Software Systems
System-level Test and Validation of Hardware/Software Systems
Author 
Sonza Reorda, Matteo. editor. Peng, Zebo. editor. Violante, Massimo. editor. SpringerLink (Online service)
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ONLINE
Electronic Access 
http://dx.doi.org/10.1007/1-84628-145-8
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23. 
Cover image for Product maturity. 1, Theoretical principals and industrial applications
Product maturity. 1, Theoretical principals and industrial applications
Author 
Bayle, Franck, author.
Preferred Shelf Number 
TA169
Electronic Access 
https://onlinelibrary.wiley.com/doi/book/10.1002/9781119902232
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24. 
Cover image for Product maturity. 2, Principles and illustrations
Product maturity. 2, Principles and illustrations
Author 
Bayle, Franck, author.
Preferred Shelf Number 
TA169
Electronic Access 
https://onlinelibrary.wiley.com/doi/book/10.1002/9781119988342
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