Search Results for Integrated circuits--Testing.

Skip to:Search Results

|

|

|

|

|

|

|

Remember to clear the cache and close the browser window.

Search Limit

Rooms Restriction Values

13

Search Field

Target Value

Limit Value

Restriction Value

Search For:

Advanced Search

Limit Search Results

Author

Wang, Laung-Terng.

(2)

Abramovici, Miron.

(1)

(1)

Agrawal, Vishwani D., 1943-

(1)

Breuer, Melvin A.

(1)

Bushnell, Michael L. (Michael Lee), 1950-

(1)

(1)

Chakrabarty, Krishnendu, editor of compilation.

(1)

Chen, Wai-Kai, 1936-

(1)

Dorf, Richard C., author

(1)

Dorf, Richard C., editor.

(1)

Friedman, Arthur D.

(1)

Frobenius, Rex.

(1)

Goel, Sandeep K, editor of compilation.

(1)

Heyman, Joseph S.

(1)

Hurst, Stanley L.

(1)

IEEE Circuits and Systems Society.

(1)

(1)

Machado, Gerson A. S., ed.

(1)

Oklobdzija, Vojin G.

(1)

Oklobdzija, Vojin G., author.

(1)

Perelroyzen, Evgeni.

(1)

Pineda de Gyvez, José.

(1)

Pradhan, Dhiraj K.

(1)

Ramaswami, Sesh.

(1)

Russell, Gordon, ed.

(1)

Scott, Allan W.

(1)

Sharma, Rohit, editor.

(1)

Stroud, Charles E.

(1)

Taylor, Gaynor, ed.

(1)

(1)

Voldman, Steven H.

(1)

Wang, Francis C.

(1)

(1)

Whitaker, Jerry C.

(1)

Wiley InterScience (Online service)

(1)

(1)

Wu, Cheng-Wen, EE Ph. D.

(1)

Yichuang Sun, ed.

(1)

Zurawski, Richard.

(1)

Language

(21)

Publication Date

-

(4)

(3)

(2)

(1)

(1)

(1)

(1)

(1)

(1)

(1)

(1)

(1)

(1)

(1)

(1)

(1)

(1)

(1)

Subject

Digital integrated circuits -- Testing.

(4)

Electronic books.

(4)

Integrated circuits--Testing.

(4)

Application-specific integrated circuits.

(3)

Integrated circuits -- Testing.

(3)

Integrated circuits -- Very large scale integration -- Testing.

(3)

Computer engineering.

(2)

Digital integrated circuits -- Design and construction.

(2)

Integrated circuits -- Very large scale integration -- Design.

(2)

Integrated circuits--Very large scale integration.

(2)

Linear integrated circuits.

(2)

(2)

Three-dimensional integrated circuits.

(2)

Cell phones -- Equipment and supplies -- Design and construction.

(1)

(1)

Digital electronics.

(1)

Digital integrated circuits.

(1)

Digitalschaltung.

(1)

Dijital entegre devreler -- Test.

(1)

Discrete cosine transforms.

(1)

Electric circuit analysis.

(1)

Electric discharges.

(1)

Electrical engineering.

(1)

Electronic apparatus and appliances -- Design and construction.

(1)

Electronic circuits--Testing.

(1)

Electronic digital computers.

(1)

Electrostatics.

(1)

Embedded computer systems -- Handbooks, manuals, etc.

(1)

Expert systems (Computer science).

(1)

Integrated circuit layout.

(1)

Integrated circuits -- Computer-aided design.

(1)

Integrated circuits -- Protection.

(1)

Integrated circuits -- Reliability -- Congresses.

(1)

Integrated circuits -- Reliability.

(1)

Integrated circuits -- Testing -- Congresses.

(1)

Integrated circuits -- Very large scale integration.

(1)

Integrated circuits industry.

(1)

Integrated circuits--Computer-aided design.

(1)

Integrated circuits--Design and construction.

(1)

Integrated circuits--Reliability.

(1)

Integrated circuits.

(1)

Logic circuits--Computer-aided design.

(1)

(1)

Low voltage integrated circuits.

(1)

Mathematical models.

(1)

Metal oxide semiconductors, Complementary -- Computer-aided design.

(1)

Metal oxide semiconductors, Complementary -- Testing.

(1)

Microelectronic packaging.

(1)

Microelectronics.

(1)

Multichip modules (Microelectronics)

(1)

Nondestructive testing -- Congresses.

(1)

Power electronics.

(1)

Production engineering.

(1)

Radio frequency integrated circuits -- Testing.

(1)

Radio frequency integrated circuits.

(1)

Semiconductors -- Design and construction.

(1)

Semiconductors -- Failures.

(1)

Semiconductors -- Testing.

(1)

Signal processing.

(1)

Simulated annealing (Mathematics).

(1)

Systems on a chip -- Testing.

(1)

Systems on a chip.

(1)

Test circuit intégré

(1)

(1)

Three-dimensional integrated circuits -- Computer-aided design.

(1)

Three-dimensional integrated circuits -- Design and construction.

(1)

Three-dimensional integrated circuits -- Testing.

(1)

(1)

Wireless communication systems -- Equipment and supplies -- Design and construction.

(1)

İntegre Devreler -- Çok geniş kapsamlı integre devreler -- Test.

(1)

Material Type

Shelf Location

Beytepe General Collection

Electronic Library

Library

Beytepe Library

{sortLabel}

	{facetName}	{results}

	{displayName}	{count}
{error}

Switch to list view

Switch to thumbnail view

24 Results Found

Subscribe to search results

1 2

000000000000DEFAULT

Print

Select a list

Make this your default list.

The following items were successfully added.

There was an error while adding the following items. Please try again.

One or more items could not be added because you are not logged in.

13.

Cover image for Embedded systems handbook

Embedded systems handbook

Embedded systems handbook

Author

Zurawski, Richard.

Preferred Shelf Number

TK7895 .E42 E64 2006

Electronic Access

Click here to view.

Format:

Availability

Online Library~1

Available:
Copies:

14.

Cover image for Microelectronics

Microelectronics

Microelectronics

Author

Whitaker, Jerry C.

Preferred Shelf Number

TK7874 .M4587 2006

Electronic Access

Click here to view.

Format:

Availability

Online Library~1

Available:
Copies:

15.

Cover image for The Computer Engineering Handbook.

The Computer Engineering Handbook.

The Computer Engineering Handbook.

Author

Oklobdzija, Vojin G., author. CRC Press LLC.

Preferred Shelf Number

TK7885 .C645 2002

Electronic Access

Taylor & Francis https://www.taylorfrancis.com/books/9781420041545
OCLC metadata license agreement http://www.oclc.org/content/dam/oclc/forms/terms/vbrl-201703.pdf

Format:

Availability

Online Library~1

Available:
Copies:

16.

Cover image for Essentials of electronic testing for digital, memory, and mixed-signal VLSI circuits

Essentials of electronic testing for digital, memory, and mixed-signal VLSI circuits

Essentials of electronic testing for digital, memory, and mixed-signal VLSI circuits

Author

Bushnell, Michael L. (Michael Lee), 1950- Agrawal, Vishwani D., 1943-

Preferred Shelf Number

TK7874.75 B87 2000

Format:

Availability

Beytepe Library~1

Available:
Copies:

17.

Cover image for Integrated circuit manufacturability the art of process and design integration

Integrated circuit manufacturability the art of process and design integration

Integrated circuit manufacturability the art of process and design integration

Author

Pineda de Gyvez, José. Pradhan, Dhiraj K. IEEE Circuits and Systems Society.

Preferred Shelf Number

ONLINE

Electronic Access

IEEE Xplore http://ieeexplore.ieee.org/xpl/bkabstractplus.jsp?bkn=5265097

Format:

Availability

Online Library~1

Available:
Copies:

18.

Cover image for VLSI Testing Digital and mixed analogue/digital techniques

VLSI Testing Digital and mixed analogue/digital techniques

VLSI Testing Digital and mixed analogue/digital techniques

Author

Hurst, Stanley L.

Preferred Shelf Number

ONLINE

Electronic Access

http://dx.doi.org/10.1049/PBCS009E

Format:

Availability

Online Library~1

Available:
Copies:

19.

Cover image for Low-power HF Microelectronics A unified approach

Low-power HF Microelectronics A unified approach

Low-power HF Microelectronics A unified approach

Author

Machado, Gerson A. S., ed.

Preferred Shelf Number

ONLINE

Electronic Access

http://dx.doi.org/10.1049/PBCS008E

Format:

Availability

Online Library~1

Available:
Copies:

20.

Cover image for Principles of semiconductor network testing

Principles of semiconductor network testing

Principles of semiconductor network testing

Author

Afshar, Amir.

Preferred Shelf Number

ONLINE

Electronic Access

ScienceDirect http://www.sciencedirect.com/science/book/9780750694728

Format:

Availability

Online Library~1

Available:
Copies:

21.

Cover image for Algorithmic and Knowledge-based CAD for VLSI

Algorithmic and Knowledge-based CAD for VLSI

Algorithmic and Knowledge-based CAD for VLSI

Author

Taylor, Gaynor, ed. Russell, Gordon, ed.

Preferred Shelf Number

ONLINE

Electronic Access

http://dx.doi.org/10.1049/PBCS004E

Format:

Availability

Online Library~1

Available:
Copies:

22.

Cover image for Digital circuit testing a guide to DFT and other techniques

Digital circuit testing a guide to DFT and other techniques

Digital circuit testing a guide to DFT and other techniques

Author

Wang, Francis C.

Preferred Shelf Number

ONLINE

Electronic Access

ScienceDirect http://www.sciencedirect.com/science/book/9780127345802

Format:

Availability

Online Library~1

Available:
Copies:

23.

Cover image for Digital systems testing and testable design

Digital systems testing and testable design

Digital systems testing and testable design

Author

Abramovici, Miron. Breuer, Melvin A. Friedman, Arthur D.

Preferred Shelf Number

ONLINE

Electronic Access

IEEE Xplore http://ieeexplore.ieee.org/xpl/bkabstractplus.jsp?bkn=5266057

Format:

Availability

Online Library~1

Available:
Copies:

24.

Cover image for Electronics reliability and measurement technology nondestructive evaluation

Electronics reliability and measurement technology nondestructive evaluation

Electronics reliability and measurement technology nondestructive evaluation

Author

Heyman, Joseph S.

Preferred Shelf Number

ONLINE

Electronic Access

ScienceDirect http://www.sciencedirect.com/science/book/9780815511717

Format:

Availability

Online Library~1

Available:
Copies:

1 2

Go to:Search Results

|

|

Copyright 2018 Sirsi Corporation - Enterprise Version 5.0.0.11