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1. 
Cover image for Characterization, testing, measurement, and metrology
Characterization, testing, measurement, and metrology
Author 
Prakash, Chander, editor. Singh, Sunpreet, 1989- editor. Davim, J. Paulo, editor.
Preferred Shelf Number 
TA410 .C457 2021
Electronic Access 
Taylor & Francis https://www.taylorfrancis.com/books/9780429298073
OCLC metadata license agreement http://www.oclc.org/content/dam/oclc/forms/terms/vbrl-201703.pdf
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2. 
Cover image for Machine Tool Metrology An Industrial Handbook
Machine Tool Metrology An Industrial Handbook
Author 
Smith, Graham T. author. SpringerLink (Online service)
Preferred Shelf Number 
ONLINE
Electronic Access 
https://doi.org/10.1007/978-3-319-25109-7
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3. 
Cover image for Handbook of optical dimensional metrology
Handbook of optical dimensional metrology
Author 
Harding, Kevin G.
Preferred Shelf Number 
T50 .H268 2013
Electronic Access 
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4. 
Cover image for Instrumentation and metrology in oceanography
Instrumentation and metrology in oceanography
Author 
Le Menn, Marc.
Preferred Shelf Number 
ONLINE
Electronic Access 
ebrary An electronic book accessible through the World Wide Web; click to view
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John Wiley http://dx.doi.org/10.1002/9781118561959
Table of contents http://catdir.loc.gov/catdir/enhancements/fy1303/2012025490-t.html
ebrary http://site.ebrary.com/id/10684971
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5. 
Cover image for Optical imaging and metrology advanced technologies
Optical imaging and metrology advanced technologies
Author 
Osten, Wolfgang. Reingand, Nadya.
Preferred Shelf Number 
ONLINE
Electronic Access 
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http://public.eblib.com/EBLPublic/PublicView.do?ptiID=947916
Wiley http://dx.doi.org/10.1002/9783527648443
http://site.ebrary.com/lib/alltitles/Doc?id=10575536
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6. 
Cover image for Semiconductor strain metrology principles and applications
Semiconductor strain metrology principles and applications
Author 
Wong, Terence K. S.
Preferred Shelf Number 
ONLINE
Electronic Access 
EBSCOhost http://search.ebscohost.com/login.aspx?direct=true&scope=site&db=nlebk&db=nlabk&AN=500610
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7. 
Cover image for Information Modeling for Interoperable Dimensional Metrology
Information Modeling for Interoperable Dimensional Metrology
Author 
Zhao, Yaoyao (Fiona). author. Brown, Robert. author. Kramer, Thomas R. author. Xu, Xun. author. SpringerLink (Online service)
Preferred Shelf Number 
ONLINE
Electronic Access 
http://dx.doi.org/10.1007/978-1-4471-2167-1
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8. 
Cover image for Springer Handbook of Metrology and Testing
Springer Handbook of Metrology and Testing
Author 
Czichos, Horst. editor. Saito, Tetsuya. editor. Smith, Leslie. editor. SpringerLink (Online service)
Preferred Shelf Number 
ONLINE
Electronic Access 
http://dx.doi.org/10.1007/978-3-642-16641-9
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9. 
Cover image for Software metrics and software metrology
Software metrics and software metrology
Author 
Abran, Alain, 1949-
Preferred Shelf Number 
ONLINE
Electronic Access 
IEEE Xplore http://ieeexplore.ieee.org/xpl/bkabstractplus.jsp?bkn=6381791
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10. 
Cover image for Computational Surface and Roundness Metrology
Computational Surface and Roundness Metrology
Author 
Muralikrishnan, Bala. author. Raja, Jay. author. SpringerLink (Online service)
Preferred Shelf Number 
ONLINE
Electronic Access 
http://dx.doi.org/10.1007/978-1-84800-297-5
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11. 
Cover image for X-ray metrology in semiconductor manufacturing
X-ray metrology in semiconductor manufacturing
Author 
Bowen, D. Keith (David Keith), 1940- author. Tanner, B. K. (Brian Keith)
Preferred Shelf Number 
TK7874.58 .B69 2006
Electronic Access 
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12. 
Cover image for Handbook of silicon semiconductor metrology
Handbook of silicon semiconductor metrology
Author 
Diebold, A. C. (Alain C.)
Preferred Shelf Number 
TK7871.85 .H3337 2001
Electronic Access 
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