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1. 
Cover image for New Trends in Nanotechnology and Fractional Calculus Applications
New Trends in Nanotechnology and Fractional Calculus Applications
Author 
Baleanu, Dumitru. editor. Guvenc, Ziya B. editor. Machado, J. A. Tenreiro. editor. SpringerLink (Online service)
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ONLINE
Electronic Access 
http://dx.doi.org/10.1007/978-90-481-3293-5
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2. 
Cover image for Embedded Memories for Nano-Scale VLSIs
Embedded Memories for Nano-Scale VLSIs
Author 
Zhang, Kevin. editor. SpringerLink (Online service)
Preferred Shelf Number 
ONLINE
Electronic Access 
http://dx.doi.org/10.1007/978-0-387-88497-4
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3. 
Cover image for Advanced Nanoscale ULSI Interconnects: Fundamentals and Applications
Advanced Nanoscale ULSI Interconnects: Fundamentals and Applications
Author 
Shacham-Diamand, Yosi. editor. Osaka, Tetsuya. editor. Datta, Madhav. editor. Ohba, Takayuki. editor. SpringerLink (Online service)
Preferred Shelf Number 
ONLINE
Electronic Access 
http://dx.doi.org/10.1007/978-0-387-95868-2
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4. 
Cover image for Nanobioelectronics - for Electronics, Biology, and Medicine
Nanobioelectronics - for Electronics, Biology, and Medicine
Author 
Offenhäusser, Andreas. editor. Rinaldi, Ross. editor. SpringerLink (Online service)
Preferred Shelf Number 
ONLINE
Electronic Access 
http://dx.doi.org/10.1007/978-0-387-09459-5
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5. 
Cover image for Mapping Nanotechnology Innovations and Knowledge Global and Longitudinal Patent and Literature Analysis
Mapping Nanotechnology Innovations and Knowledge Global and Longitudinal Patent and Literature Analysis
Author 
Roco, Mihail. author. Chen, Hsinchun. author. SpringerLink (Online service)
Preferred Shelf Number 
ONLINE
Electronic Access 
http://dx.doi.org/10.1007/978-0-387-71620-6
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6. 
Cover image for Nanometer Technology Designs High-Quality Delay Tests
Nanometer Technology Designs High-Quality Delay Tests
Author 
Tehranipoor, Mohammad. author. Ahmed, Nisar. author. SpringerLink (Online service)
Preferred Shelf Number 
ONLINE
Electronic Access 
http://dx.doi.org/10.1007/978-0-387-75728-5
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7. 
Cover image for Emerging Nanotechnologies Test, Defect Tolerance, and Reliability
Emerging Nanotechnologies Test, Defect Tolerance, and Reliability
Author 
Tehranipoor, Mohammad. editor. SpringerLink (Online service)
Preferred Shelf Number 
ONLINE
Electronic Access 
http://dx.doi.org/10.1007/978-0-387-74747-7
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8. 
Cover image for Nanoscaled Semiconductor-on-Insulator Structures and Devices
Nanoscaled Semiconductor-on-Insulator Structures and Devices
Author 
Hall, Steve. editor. Nazarov, Alexei N. editor. Lysenko, Vladimir S. editor. SpringerLink (Online service)
Preferred Shelf Number 
ONLINE
Electronic Access 
http://dx.doi.org/10.1007/978-1-4020-6380-0
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9. 
Cover image for AmIware Hardware Technology Drivers of Ambient Intelligence
AmIware Hardware Technology Drivers of Ambient Intelligence
Author 
Mukherjee, Satyen. editor. Aarts, Ronald M. editor. Roovers, Raf. editor. Widdershoven, Frans. editor. Ouwerkerk, Martin. editor.
Preferred Shelf Number 
ONLINE
Electronic Access 
http://dx.doi.org/10.1007/1-4020-4198-5
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