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1. 
Cover image for Standardized Functional Verification
Standardized Functional Verification
Author 
Wiemann, Alan. author. SpringerLink (Online service)
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http://dx.doi.org/10.1007/978-0-387-71733-3
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2. 
Cover image for Nanometer Technology Designs High-Quality Delay Tests
Nanometer Technology Designs High-Quality Delay Tests
Author 
Tehranipoor, Mohammad. author. Ahmed, Nisar. author. SpringerLink (Online service)
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http://dx.doi.org/10.1007/978-0-387-75728-5
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3. 
Cover image for Low-Power High-Level Synthesis for Nanoscale CMOS Circuits
Low-Power High-Level Synthesis for Nanoscale CMOS Circuits
Author 
Patra, Priyardarsan. author. Kougianos, Elias. author. Ranganathan, Nagarajan. author. Mohanty, Saraju P. author. SpringerLink (Online service)
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http://dx.doi.org/10.1007/978-0-387-76474-0
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4. 
Cover image for CMOS Current-Mode Circuits for Data Communications
CMOS Current-Mode Circuits for Data Communications
Author 
Yuan, Fei. author. SpringerLink (Online service)
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http://dx.doi.org/10.1007/978-0-387-47691-9
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5. 
Cover image for Closing the Power Gap Between ASIC & Custom Tools and Techniques for Low Power Design
Closing the Power Gap Between ASIC & Custom Tools and Techniques for Low Power Design
Author 
Chinnery, David. author. Keutzer, Kurt. author. SpringerLink (Online service)
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http://dx.doi.org/10.1007/978-0-387-68953-1
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6. 
Cover image for Design for Manufacturability and Yield for Nano-Scale CMOS
Design for Manufacturability and Yield for Nano-Scale CMOS
Author 
Chiang, Charles C. author. Kawa, Jamil. author. SpringerLink (Online service)
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http://dx.doi.org/10.1007/978-1-4020-5188-3
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7. 
Cover image for Dynamics of Microelectromechanical Systems
Dynamics of Microelectromechanical Systems
Author 
Lobontiu, Nicolae. author. SpringerLink (Online service)
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http://dx.doi.org/10.1007/978-0-387-68195-5
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8. 
Cover image for Layoutsynthese elektronischer Schaltungen — Grundlegende Algorithmen für die Entwurfsautomatisierung
Layoutsynthese elektronischer Schaltungen — Grundlegende Algorithmen für die Entwurfsautomatisierung
Author 
Lienig, Jens. author. SpringerLink (Online service)
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http://dx.doi.org/10.1007/3-540-29942-4
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9. 
Cover image for Electromagnetic Compatibility of Integrated Circuits Techniques for low emission and susceptibility
Electromagnetic Compatibility of Integrated Circuits Techniques for low emission and susceptibility
Author 
Ben Dhia, Sonia. editor. Ramdani, Mohamed. editor. Sicard, Etienne. editor. SpringerLink (Online service)
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http://dx.doi.org/10.1007/b137864
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10. 
Cover image for Leakage in Nanometer CMOS Technologies
Leakage in Nanometer CMOS Technologies
Author 
Narendra, Siva G. author. Chandrakasan, Anantha. author. SpringerLink (Online service)
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http://dx.doi.org/10.1007/0-387-28133-9
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11. 
Cover image for A Roadmap for Formal Property Verification
A Roadmap for Formal Property Verification
Author 
DasGupta, Pallab. author. SpringerLink (Online service)
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http://dx.doi.org/10.1007/978-1-4020-4758-9
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12. 
Cover image for Integrated System-Level Modeling of Network-on-Chip enabled Multi-Processor Platforms
Integrated System-Level Modeling of Network-on-Chip enabled Multi-Processor Platforms
Author 
Kogel, Tim. author. Leupers, Rainer. author. Meyr, Heinrich. author. SpringerLink (Online service)
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http://dx.doi.org/10.1007/1-4020-4826-2
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