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13. 
Cover image for Matching Properties of Deep Sub-Micron MOS Transistors
Matching Properties of Deep Sub-Micron MOS Transistors
Author 
Croon, Jeroen A. author. Sansen, Willy. author. Maes, Herman E. author. SpringerLink (Online service)
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ONLINE
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http://dx.doi.org/10.1007/b105122
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14. 
Cover image for Dynamic Characterisation of Analogue-to-Digital Converters
Dynamic Characterisation of Analogue-to-Digital Converters
Author 
Dallet, Dominique. author. Silva, José Machado. author. SpringerLink (Online service)
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http://dx.doi.org/10.1007/b136458
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15. 
Cover image for Bits on Chips
Bits on Chips
Author 
Veendrick, Harry. author. SpringerLink (Online service)
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https://doi.org/10.1007/978-3-319-76096-4
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16. 
Cover image for Advances in Human Factors and Systems Interaction Proceedings of the AHFE 2017 International Conference on Human Factors and Systems Interaction, July 17−21, 2017, The Westin Bonaventure Hotel, Los Angeles, California, USA
Advances in Human Factors and Systems Interaction Proceedings of the AHFE 2017 International Conference on Human Factors and Systems Interaction, July 17−21, 2017, The Westin Bonaventure Hotel, Los Angeles, California, USA
Author 
Nunes, Isabel L. editor. SpringerLink (Online service)
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https://doi.org/10.1007/978-3-319-60366-7
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17. 
Cover image for Contactless VLSI Measurement and Testing Techniques
Contactless VLSI Measurement and Testing Techniques
Author 
Sayil, Selahattin. author. SpringerLink (Online service)
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https://doi.org/10.1007/978-3-319-69673-7
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18. 
Cover image for Digital Storage in Consumer Electronics The Essential Guide
Digital Storage in Consumer Electronics The Essential Guide
Author 
Coughlin, Thomas M. author. SpringerLink (Online service)
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https://doi.org/10.1007/978-3-319-69907-3
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19. 
Cover image for Automated Validation & Verification of UML/OCL Models Using Satisfiability Solvers
Automated Validation & Verification of UML/OCL Models Using Satisfiability Solvers
Author 
Przigoda, Nils. author. Wille, Robert. author. Przigoda, Judith. author. Drechsler, Rolf. author. SpringerLink (Online service)
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https://doi.org/10.1007/978-3-319-72814-8
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20. 
Cover image for Fundamentals of Electromigration-Aware Integrated Circuit Design
Fundamentals of Electromigration-Aware Integrated Circuit Design
Author 
Lienig, Jens. author. Thiele, Matthias. author. SpringerLink (Online service)
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https://doi.org/10.1007/978-3-319-73558-0
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21. 
Cover image for Machine Learning for Model Order Reduction
Machine Learning for Model Order Reduction
Author 
Mohamed, Khaled Salah. author. SpringerLink (Online service)
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https://doi.org/10.1007/978-3-319-75714-8
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22. 
Cover image for Symbolic Parallelization of Nested Loop Programs
Symbolic Parallelization of Nested Loop Programs
Author 
Tanase, Alexandru-Petru. author. Hannig, Frank. author. Teich, Jürgen. author. SpringerLink (Online service)
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https://doi.org/10.1007/978-3-319-73909-0
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23. 
Cover image for Formal System Verification State-of the-Art and Future Trends
Formal System Verification State-of the-Art and Future Trends
Author 
Drechsler, Rolf. editor. SpringerLink (Online service)
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https://doi.org/10.1007/978-3-319-57685-5
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24. 
Cover image for Timing Performance of Nanometer Digital Circuits Under Process Variations
Timing Performance of Nanometer Digital Circuits Under Process Variations
Author 
Champac, Victor. author. Garcia Gervacio, Jose. author. SpringerLink (Online service)
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https://doi.org/10.1007/978-3-319-75465-9
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