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13. 
Cover image for Digital integrated circuits : a design perspective
Digital integrated circuits : a design perspective
Author 
Rabaey, Jan M.
Preferred Shelf Number 
TK 7874.65 R33 1996
Format: 
Availability 
Beytepe Library~1
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14. 
Cover image for Digital systems testing and testable design
Digital systems testing and testable design
Author 
Abramovici, Miron. Breuer, Melvin A. Friedman, Arthur D.
Preferred Shelf Number 
ONLINE
Electronic Access 
IEEE Xplore http://ieeexplore.ieee.org/xpl/bkabstractplus.jsp?bkn=5266057
Format: 
Availability 
Online Library~1
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