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13. 
Cover image for Principles and applications of powder diffraction
Principles and applications of powder diffraction
Author 
Clearfield, Abraham. Reibenspies, Joseph Henry. Bhuvanesh, Nattamai. Wiley InterScience (Online service)
Preferred Shelf Number 
ONLINE
Electronic Access 
John Wiley http://dx.doi.org/10.1002/9781444305487
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14. 
Cover image for X-ray diffraction by polycrystalline materials
X-ray diffraction by polycrystalline materials
Author 
Guinebretiere, Rene. Wiley InterScience (Online service)
Preferred Shelf Number 
ONLINE
Electronic Access 
Contributor biographical information http://catdir.loc.gov/catdir/enhancements/fy0704/2006037726-b.html
John Wiley http://dx.doi.org/10.1002/9780470612408
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15. 
Cover image for X-ray metrology in semiconductor manufacturing
X-ray metrology in semiconductor manufacturing
Author 
Bowen, D. Keith (David Keith), 1940- author. Tanner, B. K. (Brian Keith)
Preferred Shelf Number 
TK7874.58 .B69 2006
Electronic Access 
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16. 
Cover image for Collection of simulated XRD powder patterns for zeolites
Collection of simulated XRD powder patterns for zeolites
Author 
Treacy, M. M. J. (Michael M. J.) Higgins, John B. Treacy, M. M. J. (Michael M. J.). Collection of simulated XRD powder patterns for zeolites. International Zeolite Association. Structure Commission.
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ONLINE
Electronic Access 
ScienceDirect http://www.sciencedirect.com/science/book/9780444507020
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17. 
Cover image for Introduction to X-ray powder diffractometry
Introduction to X-ray powder diffractometry
Author 
Jenkins, Ron, 1932- Snyder, R. L. (Robert L.), 1941-
Preferred Shelf Number 
ONLINE
Electronic Access 
HathiTrust Digital Library, Limited view (search only) http://catalog.hathitrust.org/api/volumes/oclc/34476835.html
John Wiley http://dx.doi.org/10.1002/9781118520994
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