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13. 
Cover image for Digital systems testing and testable design
Digital systems testing and testable design
Author 
Abramovici, Miron. Breuer, Melvin A. Friedman, Arthur D.
Preferred Shelf Number 
ONLINE
Electronic Access 
IEEE Xplore http://ieeexplore.ieee.org/xpl/bkabstractplus.jsp?bkn=5266057
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14. 
Cover image for Electronics reliability and measurement technology nondestructive evaluation
Electronics reliability and measurement technology nondestructive evaluation
Author 
Heyman, Joseph S.
Preferred Shelf Number 
ONLINE
Electronic Access 
ScienceDirect http://www.sciencedirect.com/science/book/9780815511717
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Availability 
Online Library~1
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